Test apparatus, manufacturing method, and test method

1. A test apparatus for testing a device under test, the test apparatus comprising:

a test signal supplying section that supplies a digital input signal for testing purposes, to the device under test;

a reference signal output section that outputs an analogue reference signal in accordance with the digital input signal;

a difference obtaining section that outputs an analogue difference signal representing a difference between the analogue reference signal and an analogue output signal outputted by the device under test in accordance with the digital input signal; and

a determining section that determines whether the analogue output signal shows a defect or not based on the analogue difference signal.

2. The test apparatus according to claim 1 , wherein

the determining section includes:

an AD (analogue-to-digital) converter that converts the analogue difference signal into a digital difference signal, and

a determining part that determines whether the analogue output signal shows a defect or not based on a value of the digital difference signal.

3. The test apparatus according to claim 2 , wherein

the analogue difference signal is obtained by amplifying the difference between the analogue output signal and the analogue reference signal.

4. The test apparatus according to claim 3 , wherein

the reference signal output section

determines in which of a plurality of division ranges the digital input signal is included, the plurality of division ranges resulting from dividing a range of values that the digital input signal can take, and

outputs the analogue reference signal determined corresponding to the division range in which the digital input signal is included.

5. The test apparatus according to claim 3 , wherein

the analogue reference signal is obtained in accordance with an expected value of the analogue output signal to be outputted from the device under test in accordance with the digital input signal.

6. The test apparatus according to claim 5 , wherein

the analogue reference signal is obtained by subtracting a predetermined offset value from the expected value.

7. The test apparatus according to claim 3 , comprising:

a plurality of reference signal output sections including a first reference signal output section and a second reference signal output section; and

a selector that supplies an analogue reference signal outputted from a selected one of the reference signal output sections to the difference obtaining section, wherein

while the first reference signal output section supplies a first analogue reference signal to the difference obtaining section during a test of a first analogue output signal in accordance with a first digital input signal for testing purposes, the second reference signal output section prepares a second analogue reference signal corresponding to a second digital input signal to be inputted to the device under test next to the first digital input signal.

8. The test apparatus according to claim 3 , wherein

the difference obtaining section includes a regulator that regulates a value range of the analogue difference signal to be within a predetermined range.

9. The test apparatus according to claim 3 , wherein

the test signal supplying section sequentially supplies a plurality of digital input signals to the device under test, where each digital input signal is such that each bit of the digital input signal is sequentially set to 1 while the other bits are set to 0, and

the determining section determines that the device under test is defective when at least one of the plurality of digital input signals falls out of a predetermined error range.

10. A manufacturing method comprising:

manufacturing a device under test; and

selecting the manufactured device under test by testing the device under test using a test apparatus according to claim 1 .

11. A test method for testing a device under test, the test method comprising:

supplying a digital input signal for testing purposes, to the device under test;

outputting an analogue reference signal in accordance with the digital input signal;

outputting an analogue difference signal representing a difference between the analogue reference signal and an analogue output signal outputted by the device under test in accordance with the digital input signal; and

determining whether the analogue output signal shows a defect or not based on the analogue difference signal.