IP Library Granted Patent US 9,246,579
Granted Patent B2
US 9,246,579 · App. 14/328,715 · Granted Jan 26, 2016

Device interface apparatus, test apparatus, and test method

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Quick Facts
Patent No.
US 9,246,579
App. No.
14/328,715
Granted
Jan 26, 2016
Kind
B2
Abstract

A test apparatus that easily tests a device under test having an optical interface. Provided is a test method, a test apparatus, and a device interface apparatus on which is mounted a device under test having an optical interface, the device interface apparatus comprising a device mounting section on which the device under test is mounted; an optical connector that is connected to the optical interface of the device under test; and an optical signal detecting section that detects an optical signal output from at least one of the optical interface and the optical connector, before the optical interface of the device under test mounted on the device mounting section is connected to the optical connector.

Claims (51)

1. A device interface apparatus on which is mounted a device under test having an optical interface, the device interface apparatus comprising:

a device mounting section on which the device under test is mounted;

an optical connector that is connected to the optical interface of the device under test; and

an optical signal detecting section that detects an optical signal output from at least one of the optical interface and the optical connector, before the optical interface of the device under test mounted on the device mounting section is connected to the optical connector.

2. The device interface apparatus according to claim 1 , wherein

the optical signal detecting section includes a photoelectric converter that converts an optical signal into an electrical signal, and

the device interface apparatus comprises a moving section that moves the photoelectric converter to an optical axis of the optical signal, so that the optical signal detecting section detects the optical signal output from at least one of the optical interface and the optical connector.

3. The device interface apparatus according to claim 2 , wherein

when connecting the optical interface and the optical connector, the moving section moves the photoelectric converter away from the optical axis of the optical signal.

4. The device interface apparatus according to claim 2 , wherein the optical signal detecting section includes:

a first surface that faces an emission surface from which the optical interface outputs an optical signal and that has provided thereon a photoelectric converter that converts the optical signal output by the optical interface into an electrical signal; and

a second surface that faces an emission surface from which the optical connector outputs an optical signal and that has provided thereon a photoelectric converter that converts the optical signal output by the optical connector into an electrical signal.

5. The device interface apparatus according to claim 2 , wherein

the device under test includes a plurality of the optical interfaces,

the device interface apparatus comprises a plurality of the optical signal detecting sections and a plurality of the optical connectors corresponding to the plurality of optical interfaces and connected respectively to the plurality of optical interfaces, and

the moving section moves each of the optical signal detecting sections between the corresponding optical interface and the corresponding optical connector.

6. The device interface apparatus according to claim 1 , wherein

the optical interface outputs a plurality of optical signals, and

the corresponding optical signal detecting section includes a plurality of photoelectric converters that convert the plurality of optical signals respectively into electrical signals.

7. The device interface apparatus according to claim 6 , wherein

the optical connector outputs a plurality of optical signals, and

the corresponding optical signal detecting section includes a plurality of photoelectric converters that convert the plurality of optical signals respectively into electrical signals.

8. The device interface apparatus according to claim 7 , wherein the optical signal detecting section includes:

a first surface that faces an emission surface from which the corresponding optical interface outputs the plurality of optical signals and that has provided thereon a plurality of photoelectric converters that convert the plurality of optical signals output by the corresponding optical interface into respective electrical signals; and

a second surface that faces an emission surface from which the corresponding optical connector outputs the plurality of optical signals and that has provided thereon a plurality of photoelectric converters that convert the plurality of optical signals output by the corresponding optical connector into respective electrical signals.

9. The device interface apparatus according to claim 1 , wherein

the optical signal detecting section includes a mirror section that reflects, at a predetermined angle, an optical signal incident thereto, and

the device interface apparatus comprises a moving section that moves the mirror section to an optical axis of the optical signal, so that the optical signal detecting section detects the optical signal output from at least one of the optical interface and the optical connector.

10. The device interface apparatus according to claim 1 , wherein

the device under test further includes a device-side electrical terminal for exchanging electrical signals with outside, and

the device interface apparatus comprises a socket section that includes a socket-side electrical terminal connected to the device-side electrical terminal.

11. The device interface apparatus according to claim 10 , comprising:

a substrate having the socket section provided on the top surface thereof, and

a flexible optical transmission path having one end thereof connected to the optical connector and the other end thereof fixed to the substrate.

12. The device interface apparatus according to claim 11 , further comprising:

an optical intensity measuring section that measures intensity of an optical signal by detecting a portion of the optical signal input to the optical transmission path from the optical interface through the optical connector.

13. The device interface apparatus according to claim 12 , wherein

the optical intensity measuring section further measures intensity of an optical signal output to the optical interface, by detecting a portion of the optical signal output to the optical interface from the optical transmission path through the optical connector.

14. The device interface apparatus according to claim 1 , comprising:

an optical connector moving section that moves the optical connector toward the optical interface to optically connect the optical interface and the optical connector.

15. The device interface apparatus according to claim 14 , wherein

the device under test includes the optical interface facing a side surface of the device under test, and

the optical connector moving section moves the optical connector toward the optical interface, perpendicular to the side surface of the device under test.

16. A method for testing a device under test including an optical interface, comprising:

mounting the device under test on the device interface apparatus according to claim 1 ;

detecting an optical signal output from the device under test;

optically connecting the device under test and the device interface apparatus; and

supplying the device under test with an optical test signal through the device interface apparatus.

17. A test apparatus that tests a device under test including an optical interface, the test apparatus comprising:

the device interface apparatus according to claim 1 , on which the device under test is mounted; and

a test section that is connected to the device under test via the device interface apparatus and performs testing by supplying the device under test with a test signal.

Assignments (2)
CHANGE OF ADDRESS Recorded Dec 18, 2018
From: ADVANTEST CORPORATION
To: ADVANTEST CORPORATION
Reel/Frame 047987/0626 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 18, 2014
From: HARA, HIDEO; MASUDA, SHIN
To: ADVANTEST CORPORATION
Reel/Frame 033762/0759 →