IP Library Granted Patent US 8,314,630
Granted Patent B2
US 8,314,630 · App. 12/659,033 · Granted Nov 20, 2012

Test section unit, test head and electronic device testing apparatus

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Quick Facts
Patent No.
US 8,314,630
App. No.
12/659,033
Granted
Nov 20, 2012
Kind
B2
Abstract

A test section unit provided to a test head body includes a plurality of sockets to be attached with electronic devices to be tested and a performance board as a main substrate. All of the sockets are provided with the performance board without an intervening a socket board.

Claims (23)

1. A test section unit provided to a test head body, comprising:

a plurality of sockets to be attached with electronic devices to be tested; and

a performance board as a main substrate;

wherein all of said plurality of sockets are provided with said performance board without an intervening socket board,

a plurality of sub boards mounted with peripheral circuits is electronically connected to said performance board,

said sub boards are stacked on said performance board, and

said performance board and one of said plurality of sub boards, or two of said plurality of sub boards are electrically connected by using a stacking connector.

2. The test section unit as set forth in claim 1 , wherein said performance board is one board.

3. The test section unit as set forth in claim 1 , wherein said test section unit is provided directly to said test head body.

4. The test section unit as set forth in claim 1 , wherein said test section unit is provided to said test head body through an interface member.

5. The test section unit as set forth in claim 1 , wherein circuits generating much heat are mounted on said performance board.

6. The test section unit as set forth in claim 1 , wherein one of said plurality of sub boards is provided on the opposite side of said sockets on said performance board.

7. The test section unit as set forth in claim 1 , wherein one of said plurality of sub boards is provided in parallel with said performance board.

8. The test section unit as set forth in claim 1 , wherein said performance board comprises a performance board plate, a performance board stiffener and a performance board connector.

9. The test section unit as set forth in claim 8 , wherein said performance board connector engages with a connector of the test head body or a connector of an interface member.

10. A test head, comprising:

a test head body; and

the test section unit as set forth in claim 1 provided to said test head body.

11. The test head as set forth in claim 10 , wherein said test section unit is provided directly to said test head body.

12. The test head as set forth in claim 10 , wherein said test section unit is provided to said test head body through an interface member.

13. An electronic device testing apparatus, comprising:

the test head as set forth in claim 10 ; and

an electronic device handling apparatus for handling electronic devices to be tested and attaching said electronic devices to sockets on said test head.

Assignments (2)
CHANGE OF ADDRESS Recorded Dec 18, 2018
From: ADVANTEST CORPORATION
To: ADVANTEST CORPORATION
Reel/Frame 047987/0626 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 4, 2010
From: MURAKAMI, TORU; MINEO, HIROYUKI; YOO, JU HWAN
To: ADVANTEST CORPORATION
Reel/Frame 024353/0015 →