Electromagnetic wave measuring apparatus, measuring method, program, and recording medium
View Patent ↗An electromagnetic wave measurement device includes an electromagnetic wave outputter that outputs an electromagnetic wave having a frequency equal to or more than 0.01 THz and equal to or less than 100 THz toward a device under test. An electromagnetic wave detector detects the electromagnetic wave which has transmitted through the device under test. A relative position changer changes a relative position of an intersection of an optical path of the electromagnetic wave transmitting through the device under test and the device under test, with respect to the device under test, so that the intersection is at a predetermined relative position due to the refraction of the electromagnetic wave by the device under test. A characteristic value deriver derives a characteristic value of the electromagnetic wave based on a detection result of the electromagnetic wave detector, the characteristic value being associated with the predetermined relative position.
1. An electromagnetic wave measurement device comprising:
an electromagnetic wave outputter that outputs an electromagnetic wave having a frequency equal to or more than 0.01 THz and equal to or less than 100 THz toward a device under test;
an electromagnetic wave detector that detects the electromagnetic wave which has transmitted through the device under test;
a relative position changer that changes a relative position of an intersection of an optical path of the electromagnetic wave transmitting through the device under test and the device under test, with respect to the device under test, so that the intersection is at a predetermined relative position due to the refraction of the electromagnetic wave by the device under test; and
a characteristic value deriver that derives a characteristic value of the electromagnetic wave based on a detection result of the electromagnetic wave detector, the characteristic value being associated with the predetermined relative position,
wherein the relative position changer changes the relative position of the intersection of the optical path of the electromagnetic wave refracted by the device under test, and the device under test to coincide with the predetermined relative position.
2. The electromagnetic wave measurement device according to claim 1 , wherein the characteristic value is one of an attenuation ratio, a group delay, and a chromatic dispersion of the electromagnetic wave.
3. The electromagnetic wave measurement device according to claim 1 , wherein the relative position is represented by an angle between the intersection and a predetermined axis, and a coordinate of an orthogonal axis orthogonal to the predetermined axis at an intersection point between the orthogonal axis and the intersection.
4. The electromagnetic wave measurement device according to claim 1 , wherein the relative position changer changes an angle of the electromagnetic wave incident on the device under test.
5. The electromagnetic wave measurement device according to claim 1 , further comprising a storage that stores a difference between the predetermined relative position and the intersection of the optical path of the electromagnetic wave refracted by the device under test and the device under test,
wherein the relative position changer changes the relative position based on the difference stored in the storage.
6. An electromagnetic wave measurement method using an electromagnetic wave measurement device including: an electromagnetic wave outputter that outputs an electromagnetic wave having a frequency equal to or more than 0.01 THz and equal to or less than 100 THz toward a device under test; an electromagnetic wave detector that detects the electromagnetic wave which has transmitted through the device under test; and a relative position changer that changes a relative position of an intersection of an optical path of the electromagnetic wave transmitting through the device under test and the device under test, with respect to the device under test, the method comprising:
changing the relative position so that the intersection is at a predetermined relative position due to the refraction of the electromagnetic wave by the device under test; and
deriving a characteristic value of the electromagnetic wave based on a detection result of the electromagnetic wave detector, the characteristic value being associated with the predetermined relative position,
wherein the changing changes the relative position of the intersection of the optical path of the electromagnetic wave refracted by the device under test, and the device under test to coincide with the predetermined relative position.
7. The electromagnetic wave measurement method according to claim 6 , wherein the changing changes an angle of the electromagnetic wave incident on the device under test.
8. The electromagnetic wave measurement method according to claim 6 , wherein the electromagnetic wave measurement device further includes a storage that stores a difference between the predetermined relative position and the intersection of the optical path of the electromagnetic wave refracted by the device under test, and the device under test,
wherein the changing changes the relative position based on the difference stored in the storage.
9. A non-transitory computer-readable medium having a program of instructions for execution by a computer to perform an electromagnetic wave measurement process using an electromagnetic wave measurement device including: an electromagnetic wave outputter that outputs an electromagnetic wave having a frequency equal to or more than 0.01 THz and equal to or less than 100 THz toward a device under test; an electromagnetic wave detector that detects the electromagnetic wave which has transmitted through the device under test; and a relative position changer that changes a relative position of an intersection of an optical path of the electromagnetic wave transmitting through the device under test and the device under test, with respect to the device under test, the computer performing the electromagnetic wave measurement process by:
changing the relative position so that the intersection is at a predetermined relative position due to the refraction of the electromagnetic wave by the device under test; and
deriving a characteristic value of the electromagnetic wave based on a detection result of the electromagnetic wave detector while the characteristic value is associated with the predetermined relative position,
wherein the changing changes the relative position of the intersection of the optical path of the electromagnetic wave refracted by the device under test, and the device under test to coincide with the predetermined relative position.
10. The non-transitory computer-readable medium according to claim 9 , wherein the changing changes an angle of the electromagnetic wave incident on the device under test.
11. The non-transitory computer-readable medium according to claim 9 , wherein the electromagnetic wave measurement device further includes a storage that stores a difference between the predetermined relative position and the intersection of the optical path of the electromagnetic wave refracted by the device under test, and the device under test,
wherein the changing changes the relative position based on the difference stored in the storage.