Circuit board unit and testing apparatus
View Patent ↗Provided is a circuit board unit for connecting a connecting terminal of a testing apparatus to a connected terminal of a device under test, including: a circuit board having, on one surface, a contact corresponding to the connected terminal; and a connector guide provided on the one surface of the circuit board, the connector guide guiding a connector having the connecting terminal to the circuit board, and pulling the connector towards the circuit board. In this circuit board unit, the connector guide may bias the connector on a side of the connecting terminal, towards the circuit board. Moreover in the circuit board unit, the circuit board may further have a substrate frame that is coupled to the connector guide and biases the connector guide towards the circuit board.
1. A circuit board unit for connecting a connecting terminal
of a testing apparatus to a connected terminal of a device under test, comprising:
a circuit board having, on one surface, a contact corresponding to the connected terminal; and
a connector guide provided on the one surface of the circuit board, the connector guide contacting a connector having the connecting terminal and thereafter guiding the connector to the circuit board and pulling the connector towards the circuit board, wherein
the circuit board includes either (i) a guide hole for receiving a guide pin of the connector to align the connector on the circuit board or (ii) a guide pin for receiving a guide hole of the connector to align the connector on the circuit board, and
the connector guide includes a grooved portion to engage with an engaging pin of the connector, the engaging pin oriented substantially perpendicular to the guide pin, the engaging pin being brought into contact with the grooved portion and the grooved portion thereafter pressing down on the engaging pin due to an applied force acting substantially perpendicular to both the guide pin and the engaging pin.
2. The circuit board unit according to claim 1 , wherein
the connector guide biases the connector on a side of the connecting terminal, towards the circuit board.
3. The circuit board unit according to claim 1 , wherein
the circuit board further has a stiffener that is coupled to the connector guide and biases the connector guide towards the circuit board.
4. The circuit board unit according to claim 3 , wherein
the circuit board has a non-through hole into which a screw for coupling the stiffener is screwed.
5. The circuit board unit according to claim 1 , further comprising:
a first anisotropic conductive sheet having a front surface in contact with a rear surface of the one surface of the circuit board, and having electric conductivity solely in a thickness direction;
an interposer having a front surface in contact with a rear surface of the first anisotropic conductive sheet, and converting a layout of the contact on the one surface to a layout of the connected terminal;
a second anisotropic conductive sheet in contact with a rear surface of the interposer, and having electric conductivity solely in a thickness direction; and
an elastic conductive sheet having a through electrode that penetrates front to rear surfaces and that biases the first anisotropic conductive sheet, the interposer, and the second anisotropic conductive sheet towards the circuit board.
6. The circuit board unit according to claim 1 , wherein
the connector guide pulls the connector towards a region corresponding to a rear surface of a region in which the circuit board unit contacts the device under test.
7. A circuit board unit for connecting a connecting terminal of a testing apparatus to a connected terminal of a device under test, comprising:
a circuit board having, on one surface, a contact corresponding to the connected terminal; and
a connector guide provided on the one surface of the circuit board, the connector guide contacting a connector having the connecting terminal and thereafter guiding the connector to the circuit board and pulling the connector towards the circuit board, wherein
the connector guide includes either (i) one or more rollers that engage with a step portion of the connector and pull the connector to the circuit board or (ii) a step portion that engages with one or more rollers of the connector and pulls the connector to the circuit board.
8. The circuit board unit according to claim 7 , wherein
the connector guide includes one or more rollers that engage with a step portion of the connector and pull the connector to the circuit board, and
the one or more rollers pass through a passing portion of the connector and engage with a slope portion and a flat portion of the connector that make up the step portion.
9. The circuit board unit according to claim 7 , wherein
the connector guide includes a step portion that engages with one or more rollers of the connector and pulls the connector to the circuit board, and
the one or more rollers pass through a passing portion of the connector guide and engage with a slope portion and a flat portion of the connector guide that make up the step portion.
10. A testing apparatus for testing a device under test on a wafer, comprising:
a connector having a connecting terminal for connecting a test circuit to a connected terminal of the device under test; and
a circuit board unit that electrically connects the connecting terminal to the connected terminal, wherein the circuit board unit includes:
a circuit board having, on one surface, a contact corresponding to the connected terminal; and
a connector guide provided on the one surface of the circuit board, the connector guide contacting the connector and thereafter guiding the connector to the circuit board and pulling the connector towards the circuit board, wherein
the connector guide includes either (i) one or more rollers that engage with a step portion of the connector and pull the connector to the circuit board or (ii) a step portion that engages with one or more rollers of the connector and pulls the connector to the circuit board.
11. The testing apparatus according to claim 10 , wherein
the connector guide includes one or more rollers that engage with a step portion of the connector and pull the connector to the circuit board, and
the one or more rollers pass through a passing portion of the connector and engage with a slope portion and a flat portion of the connector that make up the step portion.
12. The testing apparatus according to claim 10 , wherein
the connector guide includes a step portion that engages with one or more rollers of the connector and pulls the connector to the circuit board, and
the one or more rollers pass through a passing portion of the connector guide and engage with a slope portion and a flat portion of the connector guide that make up the step portion.
13. A testing apparatus for testing a device under test on a wafer, comprising:
a connector having a connecting terminal for connecting a test circuit to a connected terminal of the device under test; and
a circuit board unit that electrically connects the connecting terminal to the connected terminal, wherein the circuit board unit includes:
a circuit board having, on one surface, a contact corresponding to the connected terminal; and
a connector guide provided on the one surface of the circuit board, the connector guide contacting the connector and thereafter guiding the connector to the circuit board and pulling the connector towards the circuit board, wherein
the circuit board includes either (i) a guide hole for receiving a guide pin of the connector to align the connector on the circuit board or (ii) a guide pin for receiving a guide hole of the connector to align the connector on the circuit board, and
the connector guide includes a grooved portion to engage with an engaging pin of the connector, the engaging pin oriented substantially perpendicular to the guide pin, the engaging pin being brought into contact with the grooved portion and the grooved portion thereafter pressing down on the engaging pin due to an applied force acting substantially perpendicular to both the guide pin and the engaging pin.
14. The testing apparatus according to claim 13 , wherein
the connector guide biases the connector on a side of the connecting terminal, towards the circuit board.
15. The testing apparatus according to claim 13 , wherein
the circuit board further has a stiffener that is coupled to the connector guide and biases the connector guide towards the circuit board.
16. The testing apparatus according to claim 15 , wherein
the circuit board has a non-through hole into which a screw for coupling the stiffener is screwed.
17. The testing apparatus according to claim 13 , wherein
the circuit board unit further has:
a first anisotropic conductive sheet having a front surface in contact with a rear surface of the one surface of the circuit board, and having electric conductivity solely in a thickness direction;
an interposer having a front surface in contact with a rear surface of the first anisotropic conductive sheet, and converting a layout of the contact on the one surface to a layout of the connected terminal;
a second anisotropic conductive sheet in contact with a rear surface of the interposer, and having electric conductivity solely in a thickness direction; and
an elastic conductive sheet having a through electrode that penetrates front to rear surfaces and that biases the first anisotropic conductive sheet, the interposer, and the second anisotropic conductive sheet towards the circuit board.
18. The testing apparatus according to claim 13 , wherein
the connector guide pulls the connector towards a region corresponding to a rear surface of a region in which the circuit board unit contacts the device under test.