Probe card holding apparatus with probe card engagement structure
View Patent ↗A probe card holding apparatus is provided and may be configured to hold a probe card in a test head. The probe card may include a clamp head formed at a center part of a back surface of the probe card, and a holding device provided at the test head and configured to engage with the clamp head.
1. A probe card holding apparatus configured to hold a probe card in a test head, comprising:
a clamp head formed at a center part of a back surface of the probe card and including a ring-shaped wall projecting toward the test head, the ring-shaped wall having a circumferential groove;
a holding device provided at the test head and configured to detachably engage with the circumferential groove of the clamp head;
an abutting device extending toward the probe card and abutting against the back surface of the probe card; and
a fixing device configured to fix and release the abutting device in a state where the abutting device abuts against the back surface of the probe card.
2. The probe card holding apparatus as set forth in claim 1 , further comprising:
a moving device connected to the holding device and configured to move the holding device holding the probe card with respect to the abutting device so as to pull the probe card toward the abutting device.
3. A probe card holding apparatus configured to hold a probe card in a test head, comprising:
a clamp head formed at a center part of a back surface of the probe card and including a ring-shaped wall projecting toward the test head, the ring-shaped wall having a circumferential groove; and
a holding device provided at the test head and configured to detachably engage with the circumferential groove of the clamp head, wherein
the holding device includes a plurality of balls disposed in a circumferential direction thereof and the plurality of balls are configured to engage with the circumferential groove of the clamp head.
4. The probe card holding apparatus as set forth in claim 3 , further comprising:
an abutting device extending toward the probe card and abutting against the back surface of the probe card; and
a fixing device configured to fix and release the abutting device in a state where the abutting device abuts against the back surface of the probe card.
5. The probe card holding apparatus as set forth in claim 4 , further comprising:
a moving device connected to the holding device and configured to move the holding device holding the probe card with respect to the abutting device so as to pull the probe card toward the abutting device.