Measurement apparatus and measurement method

1. A measurement apparatus that measures a frequency characteristic of a waveform generating apparatus generating a signal having a waveform corresponding to waveform data, comprising:

a control section that

causes trigger signals to be output from the waveform generating apparatus, and

causes a plurality of sine wave signals having different frequencies to be sequentially output from the waveform generating apparatus in synchronization with the trigger signals and with the trigger signals superimposed thereon;

a measuring section that measures a phase of each of the sine wave signals output from the waveform generating apparatus using a corresponding trigger signal as a reference; and

a calculating section that calculates a frequency characteristic of the waveform generating apparatus based on the measurement results of the measuring section;

wherein the control section superimposes the trigger signals having amplitudes greater than the amplitudes of the sine wave signals on the sine wave signals, and the measuring section detects, as a trigger signal, a waveform with an amplitude that is greater than or equal to a threshold value that is larger than the amplitude of the corresponding sine wave signal, from the sine wave signal on which the trigger signal is superimposed.

2. The measurement apparatus according to claim 1 , wherein the measuring section is an oscilloscope that receives the trigger signals and the sine wave signals and acquires each of the sine wave signals using the trigger signals as a reference.

3. The measurement apparatus according to claim 1 , wherein the control section causes the trigger signals to be output from the waveform generating apparatus with a prescribed period and causes the sine wave signals having frequencies that are integer multiples of a frequency of the trigger signals to be output from the waveform generating apparatus.

4. The measurement apparatus according to claim 1 , wherein the control section causes the trigger signals and the sine wave signals to be output from the waveform generating apparatus in parallel.

5. The measurement apparatus according to claim 1 , wherein the control section causes the sine wave signals to be output during intervals differing from the generation timing of the trigger signals.

6. The measurement apparatus according to claim 1 , wherein the measuring section calculates an amplitude and phase of each sine wave signal based on levels of sample points acquired while shifting the phase by ¼ of the period at a time.

7. The measurement apparatus according to claim 1 , further comprising a correcting section that corrects the waveform generating apparatus such that an inverse characteristic of the calculated frequency characteristic is added thereto.

8. A measurement apparatus that measures a frequency characteristic of a waveform generating apparatus generating a signal having a waveform corresponding to waveform data, comprising:

a control section that

causes a trigger signal to be output from the waveform generating apparatus and

causes a signal under measurement to be output from the waveform generating apparatus in synchronization with the trigger signal and with the trigger signal superimposed thereon;

a measuring section that measures the phase of the signal under measurement output from the waveform generating apparatus using the trigger signal as a reference; and

a calculating section that calculates a frequency characteristic of the waveform generating apparatus based on the measurement results of the measuring section;

wherein the control section superimposes the trigger signal having an amplitude greater than the amplitude of the signal under measurement on the signal under measurement, and the measuring section detects, as a trigger signal, a waveform with an amplitude that is greater than or equal to a threshold value that is larger than the amplitude of the signal under measurement, from the signal under measurement on which the trigger signal is superimposed.

9. A measurement apparatus that measures a frequency characteristic of a waveform acquiring apparatus generating waveform data by sampling a signal, comprising:

a control section that

causes trigger signals to be output from a waveform generating apparatus,

causes a plurality of sine wave signals having different frequencies to be output sequentially from the waveform generating apparatus in synchronization with the trigger signals and with the trigger signals superimposed thereon, and

causes the waveform acquiring apparatus to acquire waveform data of the sine wave signals;

a measuring section that measures a phase of each of the sine wave signals output from the waveform generating apparatus using a corresponding trigger signal as a reference; and

a calculating section that calculates a frequency characteristic of the waveform acquiring apparatus based on the waveform data of each sine wave signal acquired by the waveform acquiring apparatus;

wherein the control section superimposes the trigger signals having amplitudes greater than the amplitudes of the sine wave signals on the sine wave signals, and the measuring section detects, as a trigger signal, a waveform with an amplitude that is greater than or equal to a threshold value that is larger than the amplitude of the corresponding sine wave signal, from the sine wave signal on which the trigger signal is superimposed.

10. A measurement method for measuring a frequency characteristic of a waveform generating apparatus generating a signal having a waveform corresponding to waveform data, comprising:

causing trigger signals to be output from the waveform generating apparatus,

causing a plurality of sine wave signals having different frequencies to be sequentially output from the waveform generating apparatus in synchronization with the trigger signals and with the trigger signals superimposed thereon;

measuring a phase of each of the sine wave signals output from the waveform generating apparatus using a corresponding trigger signal as a reference; and

calculating a frequency characteristic of the waveform generating apparatus based on the results of the measuring;

wherein the trigger signals having amplitudes greater than the amplitudes of the sine wave signals are superimposed on the sine wave signals, and a waveform with an amplitude that is greater than or equal to a threshold value that is larger than the amplitude of the corresponding sine wave signal, from the sine wave signal on which the trigger signal is superimposed, is detected as a trigger signal.

11. A measurement method for measuring a frequency characteristic of a waveform generating apparatus generating a signal having a waveform corresponding to waveform data, comprising:

causing a trigger signal to be output from the waveform generating apparatus;

causing a signal under measurement to be output from the waveform generating apparatus in synchronization with the trigger signal and with the trigger signal superimposed thereon;

measuring a phase of the signal under measurement output from the waveform generating apparatus using the trigger signal as a reference; and

calculating a frequency characteristic of the waveform generating apparatus based on the result of the measuring;

wherein the trigger signal having an amplitude greater than the amplitude of the signal under measurement is superimposed on the signal under measurement, and a waveform with an amplitude that is greater than or equal to a threshold value that is larger than the amplitude of the signal under measurement, from the signal under measurement on which the trigger signal is superimposed, is detected as a trigger signal.

12. A measurement method for measuring a frequency characteristic of a waveform acquiring apparatus generating waveform data by sampling a signal, comprising:

causing trigger signals to be output from a waveform generating apparatus;

causing a plurality of sine wave signals having different frequencies to be output sequentially from the waveform generating apparatus in synchronization with the trigger signals and with the trigger signals superimposed thereon;

causing the waveform acquiring apparatus to acquire waveform data of the sine wave signals;

measuring a phase of each of the sine wave signals output from the waveform generating apparatus using a corresponding trigger signal as a reference; and

calculating a frequency characteristic of the waveform acquiring apparatus based on the waveform data of each sine wave signal acquired by the waveform acquiring apparatus;

wherein the trigger signals having amplitudes greater than the amplitudes of the sine wave signals are superimposed on the sine wave signals, and a waveform with an amplitude that is greater than or equal to a threshold value that is larger than the amplitude of the corresponding sine wave signal, from the sine wave signal on which the trigger signal is superimposed, is detected as a trigger signal.