Method and machine-readable media for inferring relationships between test results
View Patent ↗In one embodiment, a method for inferring relationships between test results receives sequential test data from a tester performing tests on a number of devices under test (DUTs); upon receiving a DUT identifier, determines if a data structure exists for the DUT identified by the one of the DUT identifiers; upon determining that the data structure does not exist, creates the data structure associates i) any test results associated with the one of the DUT identifiers with ii) the data structure; and upon determining that the data structure exists, creates a child data structure, as a child of the data structure, and associates i) the any test results associated with the one of the DUT identifiers with ii) the child data structure, wherein the child data structure inferentially indicates that the test results associated therewith are retest results.
1. A method for inferring relationships between test results, comprising:
receiving sequential test data from a tester performing tests on a number of devices under test (DUTs), the sequential test data comprising a number of DUT identifiers, wherein ones of the DUT identifiers are followed by any test results associated with an identified DUT;
upon receiving one of the DUT identifiers, determining if a data structure exists for the DUT identified by the one of the DUT identifiers;
upon determining that the data structure does not exist, creating the data structure and associating i) any test results associated with the one of the DUT identifiers with ii) the data structure; and
upon determining that the data structure exists, creating a child data structure, as a child of the data structure, and associating i) the any test results associated with the one of the DUT identifiers with ii) the child data structure, wherein the child data structure inferentially indicates that the test results associated therewith are retest results.
2. The method of claim 1 , further comprising, setting a parent pointer of the child data structure to the data structure.
3. The method of claim 1 , further comprising, setting a parent pointer of the data structure to a parent object.
4. The method of claim 1 , further comprising, upon receiving the one of the DUT identifiers:
determining if the one of the DUT identifiers is associated with any test results; and
if the one of the DUT identifiers is not associated with any test results, not creating the data structure or the child data structure.
5. The method of claim 1 , wherein the data structure and child data structure, if created, are created as data objects.
6. The method of claim 1 , wherein the DUT identifiers comprise locations of DUTs on a wafer.
7. The method of claim 6 , wherein the DUT identifiers further comprise wafer identifiers.
8. The method of claim 1 , wherein receiving the sequential test data from the tester comprises receiving the sequential test data by way of an intermediate data store.
9. The method of claim 8 , wherein the data store is a file.
10. The method of claim 1 , wherein plural sets of retest results are respectively associated with plural child data structures of the data structure.
11. A number of machine-readable media having stored thereon sequences of instructions that, when executed by a machine, cause the machine to perform the actions of:
receiving sequential test data from a tester performing tests on a number of devices under test (DUTs), the sequential test data comprising a number of DUT identifiers, wherein ones of the DUT identifiers are followed by any test results associated with an identified DUT;
upon receiving one of the DUT identifiers, determining if a data structure exists for the DUT identified by the one of the DUT identifiers;
upon determining that the data structure does not exist, creating the data structure and associating i) any test results associated with the one of the DUT identifiers with ii) the data structure; and
upon determining that the data structure exists, creating a child data structure, as a child of the data structure, and associating i) the any test results associated with the one of the DUT identifiers with ii) the child data structure, wherein the child data structure inferentially indicates that the test results associated therewith are retest results.
12. The media of claim 11 , wherein the sequences of instructions, when executed by the machine, further cause the machine to set a parent pointer of the child data structure to the data structure.
13. The media of claim 11 , wherein the sequences of instructions, when executed by the machine, further cause the machine to set a parent pointer of the child data structure to a parent object.
14. The media of claim 11 , wherein the sequences of instructions, when executed by the machine, further cause the machine to, upon receiving the one of the DUT identifiers:
determine if the on of the DUT identifiers is associated with any test results; and
if the one of the DUT identifiers is not associated with any test results, not create the data structure of the child data structure.
15. The media of claim 11 , wherein the structure of child data structure, if created are created as data objects.
16. The media of claim 11 , wherein the DUT identifiers comprise locations of DUTs on a wafer.
17. The media of claim 16 , wherein the DUT identifiers further comprise wafer identifiers.
18. The media of claim 11 , wherein receiving the sequential test data from the tester comprises receiving the sequential test data by way of an intermediate data store.
19. The media of claim 18 , wherein the data store is a file.
20. The media of claim 11 , wherein the sequences of instructions, when executed by the machine, further cause the machine to respectively associate plural sets of retest results with plural child data structures of the data structure.