Phase locked time interval analyzer

1. A circuit operable to perform analysis of a time interval between two measurement edges of interest in a data bit stream, said circuit comprising:

a plurality of at least three substantially interchangeable oscillators configured to be locked to a common reference frequency, said oscillators comprising digital locked-loop (DLL) circuit architecture;

a first oscillator of said plurality of oscillators operable to function in the role of a timebase oscillator;

the other oscillators of said plurality of oscillators operable to function in the roles of edge-resettable measurement oscillators;

the first oscillator of said plurality of oscillators comprising a switched and physically-immutable parametric variation operable to produce an offset in the frequency of said first oscillator relative to the frequency of said other oscillators; and

a plurality of phase detectors, each of said phase detectors coupled to one of said plurality of oscillators.

2. The circuit of claim 1 additionally comprising a plurality of counters, each of said counters coupled to one of said plurality of phase detectors.

3. The circuit of claim 1 wherein said switched and physically-immutable parametric variation comprises a small, fixed capacitance.

4. The circuit of claim 1 wherein the respective roles of said oscillators are interchanged by employing commutation and pulse steering, thereby mitigating error offsets in noise, frequency, and delay time.

5. The circuit of claim 1 additionally comprising a plurality of edge latches interconnected with said data bit stream.

6. The circuit of claim 5 wherein said plurality of edge latches comprises rising and falling edge latches.

7. The circuit of claim 5 wherein said plurality of edge latches comprises cascaded edge latches.

8. The circuit of claim 5 additionally comprising a plurality of multiplexers interconnected with said data bit stream and with said plurality of latches and additionally comprising a logic gate configured to transmit to one of said oscillators a measurement edge of interest combined with a time delay pulse from a delay generator.

9. The circuit of claim 8 additionally comprising a pass gate configured to transmit said measurement edge of interest from said data bit stream to said logic gate and to said delay generator.

10. A method of analysis of a time interval between two selected measurement edges of interest in a data bit stream, said method comprising:

locking a plurality of at least three substantially interchangeable oscillators to a common reference frequency, said oscillators comprising digital locked-loop (DLL) circuit architecture;

operating a first oscillator of said plurality of oscillators as a timebase oscillator;

operating the other oscillators of said plurality of oscillators as edge-resettable measurement oscillators;

coupling the first oscillator of said plurality of oscillators with a switched and physically-immutable parametric variation, producing an offset in the frequency of said coupled oscillator relative to the frequency of said other oscillators;

phase-aligning each of said measurement oscillators to a triggering pulse created by one of selected measurement edges of interest;

oscillating each said phase-aligned measurement oscillator until its phase matches the phase of said timebase oscillator; and

counting the number of oscillation cycles of each said phase-aligned measurement oscillator from the time of said phase-alignment until the time of said phase matching.

11. The method of claim 10 additionally comprising iterating said oscillating and said counting, thereby averaging noise across a larger data set.

12. The method of claim 11 whereby said iterating provides an evaluation of said switched and physically-immutable parametric variation and wherein said switched and physically-immutable parametric variation comprises a small, fixed capacitance.

13. The method of claim 10 wherein the respective roles of said oscillators are interchanged by commutation and pulse steering, thereby mitigating error offsets in noise, frequency, and delay time.

14. The method of claim 10 wherein creating said triggering pulse comprises transmitting said selected measurement edge of interest through a pass gate.

15. The method of claim 14 wherein creating said triggering pulse comprises generating a time delay pulse using said pass gate transmitted measurement edge and combining said time delay pulse with said pass gate transmitted measurement edge through a logic gate and wherein said selected measurement edge is transmitted through said pass gate in response to selected latched measurement edge signals.

16. The method of claim 10 wherein said phase-aligning comprises stopping said first oscillator for a duration approximately one-half of the period of oscillation of said oscillator and then restarting said oscillator.

17. The method of claim 10 wherein said locking to a common reference frequency comprises adjusting said oscillators to said reference frequency with the relation

F ref — clock =1/(2 *T delay *N mult ),

where F ref — clock is the reference frequency, T delay is the time delay, and N mult is the relative multiplication factor.

18. A system operable to perform analysis of a time interval between two measurement edges of interest in a data bit stream, said system comprising:

first, second, and third means for oscillating, wherein the means for oscillating are locked to a common reference frequency;

means for producing an offset in the frequency of the first means for oscillating relative to the frequency of said second and third means for oscillating;

means for phase-aligning each of said second and third means for oscillating to a triggering pulse created by one of said measurement edges of interest;

means for oscillating each said second and third means for oscillating until its phase matches the phase of said first oscillating means; and

means for counting the number of oscillation cycles of each said second and third means for oscillating from the time of said phase-alignment until the time of said phase matching.

19. The system of claim 18 wherein the first means for oscillating is operated as a timebase oscillator.

20. The system of claim 18 wherein the second and third means for oscillating are operated as edge-resettable measurement oscillators.