Testing apparatus, and testing method
View Patent ↗Here is provided a testing apparatus for judging whether or not a device-under-test is defect-free based on static power-supply current of the device-under-test, having a power supply for supplying power for driving the device-under-test to the device-under-test, a pattern generating section for supplying setting vectors for setting a circuit of the device-under-test into a predetermined state to the device-under-test, a power-supply current measuring section for measuring the static power-supply current supplied from the power supply to the device-under-test when the device-under-test is set into the predetermined state by the setting vectors and a judging section for obtaining temperature of the device-under-test from a temperature sensor provided within the device-under-test to judge whether or not the device-under-test is defect-free based on the static power-supply current measured by the power-supply current measuring section and the temperature of the device-under-test.
1. A testing apparatus for judging whether or not a device-under-test is defect-free based on static power-supply current of the device-under-test, comprising:
a power supply for supplying power for driving said device-under-test to said device-under-test;
a pattern generating section for supplying setting vectors for setting a circuit of said device-under-test into a predetermined state to said device-under-test;
a power-supply current measuring section for measuring said static power-supply current supplied from said power supply to said device-under-test when said device-under-test is set into said predetermined state by said setting vectors; and
a judging section for obtaining temperature of said device-under-test from a temperature sensor provided within said device-under-test to judge whether or not said device-under-test is defect-free based on said static power-supply current measured by said power-supply current measuring section and the temperature of said device-under-test.
2. The testing apparatus as set forth in claim 1 , wherein said judging section has
an expected value storage section for storing expected values of said static power-supply current given per temperature of said device-under-test; and
a comparing section for judging whether or not said device-under-test is defect-free by comparing said measured static power-supply current with said expected value corresponding to the temperature of said device-under-test when said static power-supply current is measured.
3. The testing apparatus as set forth in claim 1 , wherein said judging section has
an expected value storage section for storing expected values of said static power-supply current at temperature set in advance;
a correcting section for correcting said measured static power-supply current to a current value obtained when measured at said temperature set in advance based on the temperature of said device-under-test when said static power-supply current is measured; and
a comparing section for judging whether or not said device-under-test is defect-free by comparing the current value calculated by said correcting section with said expected value.
4. A testing method for judging whether or not a device-under-test is defect-free based on static power-supply current of the device-under-test, comprising:
a power supplying step of supplying power for driving said device-under-test to said device-under-test;
a pattern generating step of supplying setting vectors for setting a circuit of said device-under-test into a predetermined state to said device-under-test;
a power-supply current measuring step of measuring said static power-supply current supplied from said power-supply to said device-under-test when said device-under-test is set into said predetermined state by said setting vectors; and
a judging step of obtaining temperature of said device-under-test from a temperature sensor provided within said device-under-test to judge whether or not said device-under-test is defect-free based on said static power-supply current measured in said power-supply current measuring step and the temperature of said device-under-test.