Program, test apparatus and testing method
View Patent ↗A recording medium has a program recorded to operate a testing apparatus for testing an electronic device. The program causes the testing apparatus to perform functions as a comparing unit for comparing an output signal from the electronic device with an expected value, a timing generating unit for generating a rate signal and providing the comparing unit with the rate signal, wherein the rate signal determines timing at which the comparing unit compares the output signal with the expected value, a fail memory for saving the comparison results obtained by comparing the output signal with the expected value successively according to the rate signal to different addresses, and a period calculating unit for calculating a period of the output signal based on the comparison results stored successively in the fail memory, when executing a test for measuring the period of the output signal.
1. A recording medium, on which a program is recorded to operate a testing apparatus for testing an electronic device, wherein said program, when executed, causes said testing apparatus to act as:
a comparing unit for comparing an output signal from said electronic device with an expected value;
a timing generating unit for generating a rate signal and providing said comparing unit with the rate signal, wherein the rate signal determines timing at which said comparing unit compares the output signal with the expected value;
a fail memory for successively storing the comparison results obtained by comparing the output signal with the expected value according to the rate signal to different addresses; and
a period calculating unit for calculating a period of the output signal based on the comparison results stored successively in said fail memory, when executing a test for measuring the period of the output signal.
2. A recording medium as claimed in claim 1 , wherein said program further causes said testing apparatus to act as an expected value control unit for providing said comparing unit with the expected value that is fixed to a prescribed value, when executing a test for measuring the period of the output signal, and providing said comparing unit with the expected value corresponding to a test pattern supplied to said electronic device, when executing a test without measuring the period of the output signal.
3. A recording medium as claimed in claim 2 , wherein said program further causes said testing apparatus to act as a rate control unit for causing said timing generating unit to generate the rate signal with a fixed period, when executing a test for measuring the period of the output signal.
4. A recording medium as claimed in claim 3 , wherein said program causes said comparing unit to compare the output signal with the expected value until the comparison results are stored successively in all addresses of said fail memory, when executing a test for measuring the period of the output signal.
5. A recording medium as claimed in claim 4 , wherein said program causes:
said period calculating unit to generate time sequence data by arranging the comparison results each of which is stored in each address of said fail memory in time sequence;
if a number of times of switching a value of the time sequence data is larger than a prescribed value, said period calculating unit to calculate the period of the output signal based on the time sequence data; and
if the number of times of switching the value of the time sequence data is smaller than a prescribed value, said period calculating unit to store the time sequence data, said fail memory to eliminate the stored comparison results, said comparing unit to compare the output signal with the expected value until the comparison results are newly stored successively in all addresses of the fail memory, said period calculating unit to further generate new time sequence data, and said period calculating unit to calculate the period of the output signal based on the stored time sequence data and the new time sequence data.
6. A recording medium as claimed in claim 2 , wherein said program causes said testing apparatus to execute the test for measuring the period of the output signal, if an internal clock of said electronic device is supplied to said comparison unit as the output signal.
7. A testing apparatus for testing an electronic device comprising:
a comparing unit for comparing an output signal from said electronic device with an expected value;
a timing generating unit for generating a rate signal and providing said comparing unit with the rate signal, wherein the rate signal determines timing at which said comparing unit compares the output signal with the expected value;
a fail memory for saving the comparison results obtained by comparing the output signal with the expected value successively according to the rate signal to different addresses; and
a period calculating unit for calculating a period of the output signal based on the comparison results stored in said fail memory, when executing a test for measuring the period of the output signal.
8. A testing method for testing an electronic device comprising:
a comparing step for comparing an output signal from said electronic device with an expected value;
a timing generating step for generating a rate signal and providing said comparing unit with the rate signal, wherein the rate signal determines timing at which said comparing unit compares the output signal with the expected value;
a saving step for successively saving the comparison results obtained by comparing the output signal with the expected value according to the rate signal to different addresses; and
a period calculating step for calculating a period of the output signal based on the comparison results stored in said fail memory, when executing a test for measuring the period of the output signal.