Jitter measuring apparatus and a testing apparatus

1. A jitter measuring apparatus for measuring jitter of an output signal output by an electronic device comprising:

a multi-strobe generating unit for generating multi-strobe having more than or equal to three (3) strobes a plurality of times synchronously with the output signal output a plurality of times by the electronic device,

a value detecting unit for detecting a value of the output signal for each strobe of the multi-strobe generated a plurality of times by said multi-strobe generating unit,

a transition point detecting unit for detecting the position of a transition point of the value of each output signal on the basis of the value of the output signal detected by said value detecting unit, and

a histogram generating unit for counting how many times said transition point detecting unit detects the transition point at every position of the transition point of the value of the output signal.

2. A jitter measuring apparatus as claimed in claim 1 further comprising a jitter acquiring unit for acquiring jitter of the output signal on the basis of the count result of said histogram generating unit.

3. A jitter measuring apparatus as claimed in claim 2 , wherein said histogram generating unit comprises a counter for counting at which strobe of the multi-strobe the transition point of the value of the output signal is detected for each strobe on the basis of the detection result of said transition point detecting unit.

4. A jitter measuring apparatus as claimed in claim 2 , wherein said histogram generating unit comprises a transition point storage memory for storing the detection result of said transition point detecting unit.

5. A jitter measuring apparatus as claimed in claim 1 , wherein

said multi-strobe generating unit includes a plurality of serially-connected variable delay circuits for receiving strobe timing signals, delaying the received strobe timing signals by a predetermined time, and outputting each of them sequentially as the strobe,

said value detecting unit includes a plurality of timing comparing devices each of which is provided to correspond to one of said variable delay circuits and detects the value of the output signal by the strobe output by said corresponding variable delay circuit, and

said transition point detecting unit detects the position of the transition point of the value of each output signal on the basis of the detection result of said plurality of timing comparing devices.

6. A jitter measuring apparatus as claimed in claim 5 further comprising

a first comparator for comparing the value of the output signal with a first threshold value showing a H-level and outputting the comparison result as a H-level comparison result, and

a second comparator for comparing the value of the output signal with a second threshold value showing an L-level and outputting the comparison result as an L-level comparison result, wherein

said multi-strobe generating unit generates a first multi-strobe based on a timing of a rising edge of the output signal and a second multi-strobe based on a timing of a falling edge of the output signal,

said value detecting unit detects a value of the H-level comparison result by the first multi-strobe and a value of the L-level comparison result by the second multi-strobe, and

said transition point detecting unit detects a transition point of the value of the H-level comparison result as a transition point of a value of the rising edge of the output signal and a transition point of the value of the L-level comparison result as a transition point of a value of the falling edge of the output signal.

7. A jitter measuring apparatus as claimed in claim 6 , wherein

said multi-strobe generating unit includes a plurality of serially-connected first variable delay circuits for receiving a first strobe timing signal and outputting the first multi-strobe and a plurality of serially-connected second variable delay circuits for receiving a second strobe timing signal and outputting the second multi-strobe, and

said value detecting unit includes a plurality of first timing comparing devices for detecting the value of the H-level comparison result by the first multi-strobe and a plurality of second timing comparing devices for detecting the value of the L-level comparison result by the second multi-strobe.

8. A jitter measuring apparatus as claimed in claim 7 further comprising a selecting device for selecting one of the transition points of the values of the rising edge and the falling edge of the output signal detected by said transition point detecting unit and providing said histogram generating unit with it.

9. A testing apparatus for testing an electronic device comprising:

a pattern generating unit for generating a test pattern for testing the electronic device;

a pattern formatting unit for formatting the test pattern and providing the electronic device with it;

a jitter measuring apparatus for analyzing jitter of an output signal output by the electronic device according to the test pattern; and

a determining device for determining pass/fail of the electronic device on the basis of the analysis result of the jitter measuring apparatus, wherein

said jitter measuring apparatus comprises

a multi-strobe generating unit for generating multi-strobe having more than or equal to three (3) strobes a plurality of times synchronously with the output signal output a plurality of times by the electronic device,

a value detecting unit for detecting a value of the output signal for each strobe of the multi-strobe generated a plurality of times by said multi-strobe generating unit,

a transition point detecting unit for detecting the position of a transition point of the value of each output signal on the basis of the value of the output signal detected by said value detecting unit, and

a histogram generating unit for counting how many times said transition point detecting unit detects the transition point at every position of the transition point of the value of the output signal.