IP Library › Assignment 011498/0212
Patent Assignment
Reel/Frame 011498/0212

Assignment of Assignor's Interest

Recorded: 2001-01-23 Pages: 2
Assignors
UEDA, KIYOTOSHI
Executed: 2000-11-14
OOSHITA, SHOICHI
Executed: 2000-11-14
Assignee
MITSUBISHI DENKI KABUSHIKI KAISHA
2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO 100-8310, JAPAN
Covered Property (1)
Method and Apparatus for Testing Semiconductor Integrated Circuit, and Semiconductor Integrated Circuit Manufactured Thereby
Application: 09/766,845 →
Publication: US 2003/0016041
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 10, 2003
From: MITSUBISHI DENKI KABUSHIKI KAISHA
To: RENESAS TECHNOLOGY CORP.
Reel/Frame 014502/0289 →
Assignment of Assignor's Interest Apr 7, 2004
From: MITSUBISHI DENKI KABUSHIKI KAISHA
To: RENESAS TECHNOLOGY CORP.
Reel/Frame 015185/0122 →