Patent Assignment
Reel/Frame 011507/0513
Assignment of Assignor's Interest
Recorded: 2001-01-29
Received: 2001-02-14
Pages: 2
Assignor
MUTOH, AKIRA
Executed: 2001-01-24
Assignee
NEC CORPORATION
MINATO-KU, 7-1 SHIBA 5 CHOME, TOKYO, JPX, JAPAN
Covered Property
(1)
Method of and Apparatus for Developing Exposed Photoresist to Prevent Impurity from Being Attached to Wafer Surface
Application:
09/772,291 →