Patent Assignment
Reel/Frame 011545/0845
Assignment of Assignor's Interest
Recorded: 2001-02-01
Received: 2001-03-06
Pages: 4
Assignor
OKADA, KENJI
Executed: 2001-01-26
Assignee
MATSUSHITA ELECTRONICS CORPORATION
1-1, SAIWAI-CHO, TAKATSUKI-SHI, OSAKA, JPX, 569-1, JAPAN
Covered Property
(1)
Method of Predicting Lifetime of Semiconductor Integrated Circuit and Method for Reliability Testing of the Circuit
Application:
09/744,260 →