IP Library › Patent Application 09744260
Patent Application Utility PCT National Stage
App. No. 09/744,260 · Confirmation No. 7443

METHOD OF PREDICTING LIFETIME OF SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD FOR RELIABILITY TESTING OF THE CIRCUIT

Inventor: Kenji Okada
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗
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2003-08-15 IFEE Issue Fee Payment (PTO-85B) 3 View
2003-08-05 A.NA Amendment after Notice of Allowance (Rule 312) 1 View
2003-08-05 REM Applicant Arguments/Remarks Made in an Amendment 1 View
2003-08-05 LET. Miscellaneous Incoming Letter 1 View
2001-02-01 LET. Miscellaneous Incoming Letter 61 View
2001-02-01 LET. Miscellaneous Incoming Letter 61 View
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Quick Facts
App. No.
09/744,260
Filed
2001-02-01
Granted
2003-10-14
Art Unit
2829
PTA
-91 days