Patent Assignment
Reel/Frame 011578/0149
Assignment of Assignor's Interest
Recorded: 2001-02-27
Received: 2001-03-15
Pages: 3
Assignor
BLEYLE, KYLE R.
Executed: 2001-02-26
Assignee
LEICA MICROSYSTEMS INC.
3362 WALDEN AVENUE, DEPEW, NY, 14043, UNITED STATES
Covered Property
(1)
Method for determining shadowline location on a photosensitive array and critical angle refractometer employing the method
Application:
09/794,991 →