IP Library › Patent Application 09794991
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App. No. 09/794,991 · Confirmation No. 4154

Method for determining shadowline location on a photosensitive array and critical angle refractometer employing the method

Inventor: Kyle R. Bleyle
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗
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 Code Description Pages PDF
2001-02-27 TRNA Transmittal of New Application 1 View
2001-02-27 TRNA Transmittal of New Application 4 View
2001-02-27 SPEC Specification 12 View
2001-02-27 CLM Claims 4 View
2001-02-27 ABST Abstract 1 View
2001-02-27 DRW Drawings-only black and white line drawings 7 View
2001-02-27 OATH Oath or Declaration filed 3 View
2001-02-27 TRNA Transmittal of New Application 1 View
2001-02-27 TRNA Transmittal of New Application 4 View
2001-02-27 SPEC Specification 12 View
2001-02-27 CLM Claims 4 View
2001-02-27 ABST Abstract 1 View
2001-02-27 DRW Drawings-only black and white line drawings 7 View
2001-02-27 OATH Oath or Declaration filed 3 View
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Quick Facts
App. No.
09/794,991
Filed
2001-02-27
Granted
2002-05-28
Examiner
NGUYEN, TU T
Art Unit
2877
PTA
-126 days