Patent Assignment
Reel/Frame 011618/0146
Assignment of Assignor's Interest
Recorded: 2001-02-15
Received: 2001-03-29
Pages: 4
Assignor
OKADA, KENJI
Executed: 2001-02-08
Assignee
MATSUSHITA ELECTRONICS CORPORATION
1-1, SAIWAI-CHO, TAKATSUKI-SHI, OSAKA 569-1193, JPX, JAPAN
Covered Property
(1)
Method for Predicting Lifetime of Insulating Film and Method for Reliability Testing of Semiconductor Device
Application:
09/762,951 →