Patent Application
Utility
PCT National Stage
App. No. 09/762,951
· Confirmation No. 1940
METHOD FOR PREDICTING LIFETIME OF INSULATING FILM AND METHOD FOR RELIABILITY TESTING OF SEMICONDUCTOR DEVICE
Inventor:
Kenji Okada
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
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Inventors
Kenji Okada
Osaka, JAPAN
Attorneys & Agents of Record
Classification
USPC
324/551
G01R31/2648
H10P74/207
Prosecution
- Examiner
- KERVEROS, DEMETRIOS C
- Art Unit
- 2858
- Docket No.
- 740819-500
- Confirmation No.
- 1940
Foreign Priority
11-167824
·
1999-06-15
·
JAPAN
Patent Term Adjustment
-70days
RELEASE OF SECURITY INTEREST
Recorded 2019-03-29
MERGER
Recorded 2002-10-29
from
OKADA, KENJI
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2001-02-15
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Quick Facts
- App. No.
- 09/762,951
- Filed
- 2001-02-15
- Granted
- 2003-02-25
- Examiner
- KERVEROS, DEMETRIOS C
- Art Unit
- 2858
- PTA
- -70 days
External Links