Assignment of Assignor's Interest

Recorded: 2001-03-21 Pages: 2

Assignor

AJIRO, KAZUYOSHI

Executed: 2001-03-14

Assignee

NEC CORPORATION

7-1, SHIBA 5-CHOME, MINATO-KU, TOKYO, JAPAN

Covered Property (1)

Monitored burn-in test system and monitored burn-in test method of microcomputers

Application: 09/812,566 →

Publication: US 2001/0025227

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.