IP Library Patent Application 09812566
Patent Application Utility
App. No. 09/812,566 · Confirmation No. 2640

Monitored burn-in test system and monitored burn-in test method of microcomputers

Inventor: Kazuyoshi Ajiro
Abandoned -- Failure to Respond to an Office Action View Publication ↗
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Code Description Pages PDF
2001-03-21 TRNA Transmittal of New Application 1 View
2001-03-21 SPEC Specification 15 View
2001-03-21 CLM Claims 3 View
2001-03-21 ABST Abstract 1 View
2001-03-21 DRW Drawings-only black and white line drawings 5 View
2001-03-21 OATH Oath or Declaration filed 3 View
2001-03-21 TRNA Transmittal of New Application 1 View
2001-03-21 SPEC Specification 15 View
2001-03-21 CLM Claims 3 View
2001-03-21 ABST Abstract 1 View
2001-03-21 DRW Drawings-only black and white line drawings 5 View
2001-03-21 OATH Oath or Declaration filed 3 View
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Quick Facts
App. No.
09/812,566
Filed
2001-03-21
Pub. No.
US20010025227A1
Art Unit
2863