Patent Assignment
Reel/Frame 011676/0073
Assignment of Assignor's Interest
Recorded: 2001-03-27
Received: 2001-04-17
Pages: 2
Assignee
MITSUBISHI DENKI KABUSHIKI KAISHA
2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO 100-8310, JPX, JAPAN
Covered Property
(1)
Semiconductor Memory Device Allowing Mounting of Built-in Self Test Circuit Without Addition of Interface Specification
Application:
09/758,042 →