Patent Assignment
Reel/Frame 011681/0418
Assignment of Assignor's Interest
Recorded: 2001-03-22
Received: 2001-04-19
Pages: 2
Assignor
HIDAKA, HIDETO
Executed: 2001-02-14
Assignee
MITSUBISHI DENKI KABUSHIKI KAISHA
CHIYODA-KU, 2-3, MARUNOUCHI 2-CHOME, TOKYO 100-8310, JPX, JAPAN
Covered Property
(1)
Mis Semiconductor Device Having Improved Gate Insulating Film Reliability
Application:
09/813,796 →