Patent Application
Utility
App. No. 09/813,796
· Confirmation No. 3060
MIS SEMICONDUCTOR DEVICE HAVING IMPROVED GATE INSULATING FILM RELIABILITY
Inventor:
Hideto Hidaka
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2003-08-04 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2001-03-22 | TRNA |
Transmittal of New Application | 2 | View | |
| 2001-03-22 | SPEC |
Specification | 44 | View | |
| 2001-03-22 | CLM |
Claims | 4 | View | |
| 2001-03-22 | ABST |
Abstract | 1 | View | |
| 2001-03-22 | DRW |
Drawings-only black and white line drawings | 16 | View | |
| 2001-03-22 | OATH |
Oath or Declaration filed | 3 | View |
Inventors
Hideto Hidaka
Hyogo, JAPAN
Attorneys & Agents of Record
Classification
USPC
365/189.09
G11C11/413
G11C8/08
Prosecution
- Examiner
- YOHA, CONNIE C
- Art Unit
- 2818
- Docket No.
- 57454-027
- Confirmation No.
- 3060
Foreign Priority
2000-260379
·
2000-08-30
·
JAPAN
Publication
- Pub. No.
- US20020024059A1
- Pub. Date
- 2002-02-28
Patent Term Adjustment
0days
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2011-03-18
from
HIDAKA, HIDETO
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2001-03-22
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Quick Facts
- App. No.
- 09/813,796
- Filed
- 2001-03-22
- Granted
- 2003-09-30
- Pub. No.
- US20020024059A1
- Examiner
- YOHA, CONNIE C
- Art Unit
- 2818
- PTA
- 0 days
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