Patent Assignment
Reel/Frame 025980/0219
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded: 2011-03-18
Received: 2011-03-18
Pages: 67
Assignor
MITSUBISHI DENKI KABUSHIKI KAISHA
Executed: 2011-03-07
Assignee
RENESAS ELECTRONICS CORPORATION
1753, SHIMONUMABE, NAKAHARA-KU, KAWASAKI-SHI,, KANAGAWA, JPX, 211-8668, JAPAN
Covered Applications
(100)
ROOF RACK CONNECTION ASSEMBLY
App. No. 29/379,476
→
MAGNETIC MEMORY DEVICE CAPABLE OF PASSING BIDIRECTIONAL CURRENTS THROUGH THE BIT LINES.
App. No. 10/797,199
→
METHOD OF MAKING SEMICONDUCTOR DEVICE
App. No. 10/663,940
→
LEVEL CONVERSION CIRCUIT CONVERTING LOGIC LEVEL OF SIGNAL
App. No. 10/426,653
→
MAGNETIC MEMORY DEVICE AND MAGNETIC SUBSTRATE
App. No. 10/424,086
→
D/A CONVERTER WITH HIGH JITTER RESISTANCE
App. No. 10/408,238
→
DATA RECEIVING DEVICE FOR RECEIVING SERIAL DATA ACCORDING TO OVER-SAMPLING
App. No. 10/388,743
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SEMICONDUCTOR MEMORY HAVING MEMORY CELLS AND DEVICE FOR CONTROLLING DATA WRITTEN IN THE SEMICONDUCTOR MEMORY
App. No. 10/383,577
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SEMICONDUCTOR MEMORY DEVICE CAPABLE OF HOLDING WRITE DATA FOR LONG TIME
App. No. 10/378,852
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CAM CELL ARRAY, TCAM CELL, TCAM CELL ARRAY, ADDRESS SEARCH MEMORY, AND NETWORK ADDRESS SEARCH APPARATUS
App. No. 10/374,103
→
SEMICONDUCTOR MEMORY DEVICE HAVING REFRESH SIZE SETTING CIRCUIT
App. No. 10/359,058
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CHARACTERISTIC EVALUATION APPARATUS FOR INSULATED GATE TYPE TRANSISTORS
App. No. 10/350,059
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MEMORY SYSTEM
App. No. 10/318,097
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SEMICONDUCTOR MEMORY DEVICE PREVENTING ERRONEOUS WRITING IN WRITE OPERATION AND DELAY IN READ OPERATION
App. No. 10/302,963
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SEMICONDUCTOR DEVICE INCLUDING MEMORY WITH REDUCED CURRENT CONSUMPTION
App. No. 10/277,879
→
POWER ON RESET CIRCUIT
App. No. 10/268,687
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METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE
App. No. 10/252,519
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METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE HAVING TIE BARS FOR INTERCONNECTING LEADS
App. No. 10/241,294
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LOW-POWER SEMICONDUCTOR MEMORY DEVICE
App. No. 10/230,213
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SEMICONDUCTOR MEMORY DEVICE WITH IMPROVED FLEXIBLE REDUNDANCY SCHEME
App. No. 10/229,001
→
PLASMA REACTOR
App. No. 10/228,999
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SEMICONDUCTOR MEMORY DEVICE PERMITTING EARLY DETECTION OF DEFECTIVE TEST DATA
App. No. 10/227,381
→
SEMICONDUCTOR INTEGRAGED CIRCUIT DEVICE WITH NOISE FILTER
App. No. 10/226,353
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MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE WITH A LARGER CONTACT HOLE OPENING
App. No. 10/212,259
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SEMICONDUCTOR DEVICE WITH RESISTOR LAYER HAVING HEAT RADIATION PATH TO SEMICONDUCTOR SUBSTRATE
App. No. 10/208,993
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SEMICONDUCTOR MEMORY DEVICE WITH BLOCK-UNIT ERASE TYPE NONVOLATILE MEMORY
App. No. 10/207,379
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INDUCTOR WITH PATTERNED GROUND SHIELD
App. No. 10/207,233
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METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
App. No. 10/206,209
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SEMICONDUCTOR LOGIC CIRCUIT DEVICE OF LOW CURRENT CONSUMPTION
App. No. 10/206,879
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SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
App. No. 10/194,233
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DIGITAL-TO-ANALOG CONVERTING CIRCUIT GIVING LINEAR RELATION BETWEEN DIGITAL CODE AND OSCILLATION FREQUENCY OF OSCILLATOR
App. No. 10/193,318
→
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
App. No. 10/193,150
→
DYNAMIC SEMICONDUCTOR MEMORY DEVICE WITH ADJUSTABLE REFRESH FREQUENCY
App. No. 10/192,721
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MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE
App. No. 10/192,552
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SEMICONDUCTOR DEVICE HAVING MEMORY CELL AND PERIPHERAL CIRCUITRY WITH DUMMY ELECTRODE
App. No. 10/191,458
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SYNCHRONOUS SEMICONDUCTOR MEMORY DEVICE CAPABLE OF REDUCING TEST COST AND METHOD OF TESTING THE SAME
App. No. 10/190,693
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THIN FILM MAGNETIC MEMORY DEVICE REALIZING BOTH HIGH-SPEED DATA READING OPERATION AND STABLE OPERATION
App. No. 10/189,528
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SEMICONDUCTOR MEMORY
App. No. 10/188,977
→
SEMICONDUCTOR DEVICE
App. No. 10/176,656
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SEMICONDUCTOR DEVICE WITH REDUCED CURRENT CONSUMPTION IN STANDBY STATE
App. No. 10/167,437
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SEMICONDUCTOR MEMORY DEVICE HAVING WRITE COLUMN SELECT GATE
App. No. 10/166,122
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THIN FILM MAGNETIC MEMORY DEVICE CONDUCTING DATA READ OPERATION WITHOUT USING A REFERENCE CELL
App. No. 10/164,548
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SEMICONDUCTOR MEMORY DEVICE
App. No. 10/164,651
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SEMICONDUCTOR DEVICE INCLUDING HIGH-FREQUENCY CIRCUIT WITH INDUCTOR
App. No. 10/163,613
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SEMICONDUCTOR MEMORY DEVICE READING DATA BASED ON MEMORY CELL PASSING CURRENT DURING ACCESS
App. No. 10/160,256
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POWER SUPPLY CIRCUIT STABLY SUPPLYING POWER SUPPLY POTENTIAL EVEN TO LOAD CONSUMING RAPIDLY CHANGING CURRENT AND SEMICONDUCTOR MEMORY DEVICE WITH SAME
App. No. 10/157,184
→
THIN FILM MAGNETIC MEMORY DEVICE HAVING A REDUNDANT STRUCTURE
App. No. 10/153,737
→
SEMICONDUCTOR DEVICE
App. No. 10/153,620
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SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE PROVIDED WITH A SELF-TESTING CIRCUIT FOR CARRYING OUT AN ANALYSIS FOR REPAIR BY USING A REDUNDANT MEMORY CELL
App. No. 10/152,689
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CLOCK GENERATOR FOR GENERATING INTERNAL CLOCK SIGNAL SYNCHRONIZED WITH REFERENCE CLOCK SIGNAL
App. No. 10/152,009
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NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE WITH A MEMORY ARRAY PREVENTING GENERATION OF A THROUGH CURRENT PATH
App. No. 10/146,031
→
TESTER FOR SEMICONDUCTOR INTEGRATED CIRCUITS
App. No. 10/145,192
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SEMICONDUCTOR MEMORY DEVICE HAVING SELF-REFRESH MODE
App. No. 10/142,156
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A/D CONVERTER WITH HIGH-SPEED INPUT CIRCUIT
App. No. 10/141,115
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PLL CIRCUIT INCLUDING A CONTROL LOGIC CIRCUIT FOR ADJUSTING THE DELAY TIMES OF THE CLOCKS SO THAT THE PHASE ERROR OF THE CLOCKS IS REDUCED
App. No. 10/141,143
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NONVOLATILE SEMICONDUCTOR MEMORY DEVICE CAPABLE OF WRITING MULTILEVEL DATA AT HIGH RATE
App. No. 10/140,105
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SEMICONDUCTOR MEMORY DEVICE HAVING HIERARCHICAL WORD LINE STRUCTURE
App. No. 10/139,334
→
SEMICONDUCTOR MEMORY SYSTEM
App. No. 10/138,267
→
SEMICONDUCTOR MEMORY DEVICE AND TESTING METHOD THEREFOR
App. No. 10/137,352
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SEMICONDUCTOR DEVICE WITH INSULATING GATE SURROUNDED BY IMPURITY LAYERS
App. No. 10/137,289
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THIN FILM MAGNETIC MEMORY DEVICE HAVING DATA READ CURRENT TUNING FUNCTION
App. No. 10/135,459
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RESISTANCE CHANGEABLE DEVICE FOR DATA TRANSMISSION SYSTEM
App. No. 10/135,381
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SEMICONDUCTOR DEVICE WITH SMALL CURRENT CONSUMPTION HAVING STABLY OPERATING INTERNAL CIRCUITRY
App. No. 10/135,380
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SEMICONDUCTOR DEVICE
App. No. 10/134,428
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SEMICONDUCTOR DEVICE THAT CAN HAVE A DEFECTIVE BIT FOUND DURING OR AFTER PACKAGING PROCESS REPAIRED
App. No. 10/127,759
→
SEMICONDUCTOR CIRCUIT DEVICE WITH IMPROVED SURGE RESISTANCE
App. No. 10/123,164
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SEMICONDUCTOR CIRCUIT AND SEMICONDUCTOR DEVICE
App. No. 10/122,234
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SEMICONDUCTOR DEVICE HAVING A SOLID-STATE IMAGE SENSOR
App. No. 10/121,699
→
SEMICONDUCTOR MEMORY DEVICE
App. No. 10/120,445
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SEMICONDUCTOR MEMORY DEVICE INCLUDING INTERNAL POWER CIRCUIT HAVING TUNING FUNCTION
App. No. 10/120,575
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SEMICONDUCTOR MEMORY DEVICE WITH REDUCED NUMBER OF REDUNDANT PROGRAM SETS
App. No. 10/119,782
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SEMICONDUCTOR MEMORY DEVICE INCLUDING PLURALITY OF GLOBAL DATA LINES IN PARALLEL ARRANGEMENT WITH LOW PARASITIC CAPACITANCE, AND FABRICATION METHOD THEREOF
App. No. 10/118,126
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SEMICONDUCTOR MEMORY DEVICE OPERABLE FOR BOTH OF CAS LATENCIES OF ONE AND MORE THAN ONE
App. No. 10/118,011
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SEMICONDUCTOR MEMORY DEVICE HAVING CELL PLATE ELECTRODES ALLOWING INDEPENDENT POWER SUPPLY FOR EACH REDUNDANT REPLACEMENT UNIT
App. No. 10/118,433
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SEMICONDUCTOR CIRCUIT DEVICE WITH IMPROVED SPECIAL MODE
App. No. 10/109,857
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SEMICONDUCTOR DEVICE
App. No. 10/106,198
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SEMICONDUCTOR MEMORY DEVICE
App. No. 10/103,999
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STATIC-TYPE SEMICONDUCTOR MEMORY DEVICE
App. No. 10/096,728
→
MAGNETIC RANDOM-ACCESS MEMORY
App. No. 10/096,878
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THIN FILM MAGNETIC MEMORY DEVICE CAPABLE OF EASILY CONTROLLING A DATA WRITE CURRENT
App. No. 10/096,481
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SEMICONDUCTOR MEMORY DEVICE INCLUDING AN SOI SUBSTRATE
App. No. 10/094,918
→
APPARATUS AND METHOD FOR CONTROLLING SEMICONDUCTOR MANUFACTURING SYSTEM UTILIZING RECYCLED WAFERS
App. No. 10/095,040
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CHARACTERISTIC EVALUATION APPARATUS FOR INSULATED GATE TYPE TRANSISTORS
App. No. 10/093,936
→
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
App. No. 10/090,607
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SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE INCLUDING A CLOCK SYNCHRONOUS TYPE LOGICAL PROCESSING CIRCUIT
App. No. 10/086,874
→
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
App. No. 10/083,116
→
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE
App. No. 10/071,188
→
FAST ACCESSIBLE DYNAMIC TYPE SEMICONDUCTOR MEMORY DEVICE
App. No. 10/067,822
→
METHOD OF MANUFACTURING A SEMICONDUCTOR MEMORY DEVICE HAVING A CAPACITOR WITH IMPROVED DIELECTRIC LAYER
App. No. 10/059,122
→
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE CAPABLE OF SUPPRESSING REDUCTION OF BIT LINE POTENTIAL IN WRITE-BACK OPERATION AND ERASE METHOD
App. No. 10/056,107
→
STATIC SEMICONDUCTOR MEMORY DEVICE
App. No. 10/056,069
→
SEMICONDUCTOR MEMORY DEVICE
App. No. 10/056,111
→
SEMICONDUCTOR INTEGRATED CIRCUIT
App. No. 10/051,054
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SEMICONDUCTOR MEMORY DEVICE HAVING A COLUMN SELECT LINE TRANSMITTING A COLUMN SELECT SIGNAL
App. No. 10/050,131
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DEMODULATOR AND DEMODULATION METHOD OF DQPSK SYSTEM WITH REDUCED CIRCUIT SCALE
App. No. 10/046,162
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SEMICONDUCTOR MEMORY DEVICE HAVING FUNCTION OF SUPPLYING STABLE POWER SUPPLY VOLTAGE
App. No. 10/036,512
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SEMICONDUCTOR INTEGRATED CIRCUIT
App. No. 10/033,924
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DATA PROCESSOR HAVING REPEAT INSTRUCTION PROCESSING USING EXECUTED INSTRUCTION NUMBER COUNTER
App. No. 10/028,697
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MEMORY CIRCUIT/LOGIC CIRCUIT INTEGRATED DEVICE CAPABLE OF REDUCING TERM OF WORKS
App. No. 10/003,255
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SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE HAVING A HIERARCHICAL POWER SOURCE CONFIGURATION
App. No. 09/996,757
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