Patent Application
Utility
App. No. 10/227,381
· Confirmation No. 5896
SEMICONDUCTOR MEMORY DEVICE PERMITTING EARLY DETECTION OF DEFECTIVE TEST DATA
Inventor:
Yutaka Ikeda
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2003-08-26 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2002-08-26 | TRNA |
Transmittal of New Application | 2 | View | |
| 2002-08-26 | SPEC |
Specification | 18 | View | |
| 2002-08-26 | CLM |
Claims | 2 | View | |
| 2002-08-26 | ABST |
Abstract | 1 | View | |
| 2002-08-26 | DRW |
Drawings-only black and white line drawings | 5 | View | |
| 2002-08-26 | OATH |
Oath or Declaration filed | 3 | View |
Inventors
Yutaka Ikeda
Hyogo, JAPAN
Attorneys & Agents of Record
Classification
USPC
365/194
G11C29/12015
G11C11/401
G11C29/12
Prosecution
- Examiner
- PHUNG, ANH K
- Art Unit
- 2824
- Docket No.
- 57454-701
- Confirmation No.
- 5896
Foreign Priority
2002-055235 (P)
·
2002-03-01
·
JAPAN
Publication
- Pub. No.
- US20030165077A1
- Pub. Date
- 2003-09-04
Patent Term Adjustment
0days
No related applications found.
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2011-03-18
from
IKEDA, YUTAKA
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2002-08-26
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Quick Facts
- App. No.
- 10/227,381
- Filed
- 2002-08-26
- Granted
- 2003-11-04
- Pub. No.
- US20030165077A1
- Examiner
- PHUNG, ANH K
- Art Unit
- 2824
- PTA
- 0 days
External Links