Patent Assignment
Reel/Frame 013242/0729
Assignment of Assignor's Interest
Recorded: 2002-08-26
Pages: 2
Assignor
IKEDA, YUTAKA
Executed: 2002-07-03
Assignee
MITSUBISHI DENKI KABUSHIKI KAISHA
2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO 100-8310, JAPAN
Covered Property
(1)
Semiconductor Memory Device Permitting Early Detection of Defective Test Data
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.