Patent Application
Utility
App. No. 10/190,693
· Confirmation No. 3888
SYNCHRONOUS SEMICONDUCTOR MEMORY DEVICE CAPABLE OF REDUCING TEST COST AND METHOD OF TESTING THE SAME
Inventor:
Tsukasa Ooishi
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2002-07-09 | TRNA |
Transmittal of New Application | 3 | View | |
| 2002-07-09 | A.PE |
Preliminary Amendment | 5 | View | |
| 2002-07-09 | SPEC |
Specification | 70 | View | |
| 2002-07-09 | CLM |
Claims | 9 | View | |
| 2002-07-09 | ABST |
Abstract | 1 | View | |
| 2002-07-09 | DRW |
Drawings-only black and white line drawings | 58 | View | |
| 2002-07-09 | OATH |
Oath or Declaration filed | 3 | View |
Inventors
Tsukasa Ooishi
Hyogo, JAPAN
Attorneys & Agents of Record
Classification
USPC
714/7
G11C29/14
G11C29/12015
Prosecution
- Examiner
- RAY, GOPAL C
- Art Unit
- 2181
- Docket No.
- 57454-601
- Confirmation No.
- 3888
Foreign Priority
11-010507(P)
·
1999-01-19
·
JAPAN
Publication
- Pub. No.
- US20020194546A1
- Pub. Date
- 2002-12-19
Patent Term Adjustment
0days
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2011-03-18
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Quick Facts
- App. No.
- 10/190,693
- Filed
- 2002-07-09
- Granted
- 2003-04-08
- Pub. No.
- US20020194546A1
- Examiner
- RAY, GOPAL C
- Art Unit
- 2181
- PTA
- 0 days
External Links