Granted Patent
Utility
US 6,574,159
· Confirmation No. 8907
SEMICONDUCTOR MEMORY DEVICE AND TESTING METHOD THEREFOR
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2002-05-03 | TRNA |
Transmittal of New Application | 2 | View | |
| 2002-05-03 | SPEC |
Specification | 98 | View | |
| 2002-05-03 | CLM |
Claims | 8 | View | |
| 2002-05-03 | ABST |
Abstract | 1 | View | |
| 2002-05-03 | DRW |
Drawings-only black and white line drawings | 35 | View | |
| 2002-05-03 | OATH |
Oath or Declaration filed | 4 | View |
Inventors
Attorneys & Agents of Record
Classification
USPC
365/201
G11C29/83
G11C11/41
G11C29/50
G11C29/832
G11C2029/5006
Prosecution
- Examiner
- MAI, SON LUU
- Art Unit
- 2818
- Docket No.
- 57454-557
- Confirmation No.
- 8907
Foreign Priority
2001-141652
·
2001-05-11
·
JAPAN
2002-15659
·
2002-01-24
·
JAPAN
2002-43531
·
2002-02-20
·
JAPAN
Publication
- Pub. No.
- US20020167849A1
- Pub. Date
- 2002-11-14
Patent Term Adjustment
0days
No related applications found.
CHANGE OF ADDRESS
Recorded 2017-11-29
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2011-03-18
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2002-05-03
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Quick Facts
- Patent No.
- US 6,574,159
- App. No.
- 10/137,352
- Filed
- 2002-05-03
- Granted
- 2003-06-03
- Pub. No.
- US20020167849A1
- Examiner
- MAI, SON LUU
- Art Unit
- 2818
- PTA
- 0 days
External Links