Patent Assignment
Reel/Frame 011745/0609
Assignment of Assignor's Interest
Recorded: 2001-04-24
Received: 2001-05-04
Pages: 2
Assignees
MITSUBISHI DENKI KABUSHIKI KAISHA
2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO 100-8310, JPX, JAPAN
RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION
1 MIZUHARA 4-CHOME, OTA,O-SHI, HYOGO 664-0005, JPX, JAPAN
Covered Property
(1)
Method and Apparatus for Testing Semiconductor Devices Using Improved Testing Sequence
Application:
09/840,069 →