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App. No. 09/840,069 · Confirmation No. 2165

METHOD AND APPARATUS FOR TESTING SEMICONDUCTOR DEVICES USING IMPROVED TESTING SEQUENCE

Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗ View Publication ↗
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 Code Description Pages PDF
2004-02-26 COCIN Request for Certificate of Correction 2 View
2003-09-15 IFEE Issue Fee Payment (PTO-85B) 1 View
2001-04-24 TRNA Transmittal of New Application 2 View
2001-04-24 SPEC Specification 25 View
2001-04-24 CLM Claims 3 View
2001-04-24 ABST Abstract 1 View
2001-04-24 DRW Drawings-only black and white line drawings 12 View
2001-04-24 OATH Oath or Declaration filed 3 View
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Quick Facts
App. No.
09/840,069
Filed
2001-04-24
Granted
2003-11-11
Pub. No.
US20020070746A1
Art Unit
2829
PTA
-57 days