Patent Assignment
Reel/Frame 024973/0598
Change of Name
Recorded: 2010-09-13
Received: 2010-09-13
Pages: 50
Assignor
RENESAS TECHNOLOGY CORP.
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753, SHIMONUMABE, NAKAHARA-KU, KAWASAKI-SHI,, KANAGAWA, JPX, 211-8668, JAPAN
Covered Properties
(89)
Semiconductor Device and Method of Manufacturing the Same
Application:
12/753,521 →
Method of Manufacturing Semiconductor Device That Uses Both a Normal Photomask and a Phase Shift Mask for Defining Interconnect Patterns
Application:
12/720,248 →
Method of Manufacturing Semiconductor Device
Application:
12/648,276 →
Semiconductor Device and Manufacturing Method Thereof for Reducing the Area of the Memory Cell Region
Application:
12/636,408 →
Manufacturing Method of Semiconductor Device
Application:
12/547,907 →
Method for Manufacturing Non-Volatile Semiconductor Memory Device, and Non-Volatile Semiconductor Memory Device
Application:
12/537,652 →
Method for Manufacturing Magnetic Memory Chip Device
Application:
12/525,999 →
E-Mail Messaging System and Method for Enhanced Rich Media Delivery
Application:
12/511,436 →
Semiconductor Device and Method of Manufacturing the Same
Application:
12/401,193 →
Semiconductor Device Having Element Isolation Region
Application:
12/273,163 →
Apparatus and Method for Manufacturing Semiconductor Device
Application:
12/255,941 →
Semiconductor Device and Manufacturing Method Thereof for Reducing the Area of the Memory Cell Region
Application:
12/237,693 →
Semiconductor Device
Application:
12/210,492 →
Semiconductor Device
Application:
12/178,373 →
Resin Molded Semiconductor Device and Differential Amplifier Circuit
Application:
12/073,384 →
Method of Manufacturing Semiconductor Device That Uses Both a Normal Photomask and a Phase Shift Mask for Defining Interconnect Patterns
Application:
12/010,793 →
Semiconductor Device Having Resistor Elements and Method for Manufacturing the Same
Application:
12/007,496 →
Semiconductor Device with Electrode Pad Having Probe Mark
Application:
11/898,138 →
Semiconductor device and method of manufacturing the same
Application:
11/882,662 →
Polishing Apparatus
Application:
11/878,028 →
Polishing Apparatus
Application:
11/878,030 →
Semiconductor Device Having Capacitors for Reducing Power Source Noise
Application:
11/797,544 →
Manufacturing Method of Semiconductor Device
Application:
11/638,500 →
Method of Manufacturing Semiconductor Device
Application:
11/637,097 →
Method of Manufacturing a Semiconductor Device Including a Bump Forming Process
Application:
11/633,591 →
Semiconductor Device and Manufacturing Method Thereof for Reducing the Area of the Memory Cell Region
Application:
11/541,656 →
Semiconductor Device with Terminals, and Method of Manufacturing the Same
Application:
11/473,081 →
Semiconductor Device and Method of Manufacturing the Same
Application:
11/406,337 →
Semiconductor Device Including Capsule Type Semiconductor Package and Semiconductor Chip in Stacking Manner
Application:
11/347,292 →
Method for Manufacturing Non-Volatile Semiconductor Memory Device, and Non-Volatile Semiconductor Memory Device
Application:
11/172,886 →
Semiconductor Device Having Capacitors for Reducing Power Source Noise
Application:
11/064,822 →
Semiconductor Device with Electrode Pad Having Probe Mark
Application:
10/958,413 →
Method of Manufacturing a Semiconductor Device Including a Bump Forming Process
Application:
10/954,520 →
Semiconductor Apparatus Utilizing a Preparatory Stage for a Chip Assembly
Application:
10/798,345 →
Apparatus for Testing Semiconductor Integrated Circuit
Application:
10/647,267 →
Semiconductor Device with a Fluorinated Silicate Glass Film as an Interlayer Metal Dielectric Film, and Manufacturing Method Thereof
Application:
10/446,876 →
Semiconductor Integrated Circuit and Test System for Testing the Same
Application:
10/426,663 →
Semiconductor Device
Application:
10/389,958 →
Semiconductor Device
Application:
10/382,497 →
Semiconductor Device with Stacked Semiconductor Elements
Application:
10/376,269 →
A Semiconductor Device with Reduced Wiring Paths Between an Array of Semiconducter Chip Parts
Application:
10/348,013 →
Apparatus, Method and Pattern for Evaluating Semiconductor Device Characteristics
Application:
10/345,950 →
.Lead Frame, and Method for Manufacturing Semiconductor Device and Method for Inspecting Electrical Properties of Small Device Using the Lead Frame
Application:
10/342,398 →
Semiconductor Device with Terminals, and Method of Manufacturing the Same
Application:
10/336,801 →
Method of Fabricating a Diode Protecting a Gate Electrode of a Field Effect Transistor
Application:
10/309,022 →
Semiconductor Device
Application:
10/303,737 →
Semiconductor Integrated Circuit Device
Application:
10/301,837 →
Lead Frame
Application:
10/256,006 →
Semiconductor Device
Application:
10/224,342 →
Semiconductor Device Having Semiconductor Element Packaged on Interposer
Application:
10/222,841 →
Semiconductor Device Having an Improved Isolation Structure, and Method of Manufacturing the Semiconductor Device
Application:
10/214,603 →
Semiconductor Device
Application:
10/170,588 →
Method of Attaching a Semiconductor Chip to a Chip Mounting Substrate
Application:
10/159,123 →
Polishing Method Using Ceria Slurry, and Method of Manufacturing Semiconductor Device
Application:
10/156,014 →
Semiconductor Device, Test Method for Semiconductor Device, and Tester for Semiconductor Device
Application:
10/124,453 →
Method of Manufacturing Semiconductor Device Including a Step of Forming Element Isolation Trench and Semiconductor Device
Application:
10/119,065 →
Cleaning Process for Photomasks
Application:
10/119,009 →
Semiconductor Device and Manufacturing Method Thereof
Application:
10/114,264 →
Semiconductor Device, Method of Fabricating the Same and Semiconductor Device Fabricating Apparatus
Application:
10/090,842 →
Test Pattern Generation Circuit and Method for Use with Self-Diagnostic Circuit
Application:
10/059,118 →
Semiconductor Device and Wire Bonding Apparatus
Application:
10/050,166 →
Semiconductor Device Having Improved Contact Hole Structure, and Method of Manufacturing the Same
Application:
10/045,009 →
Semiconductor Device and Manufacturing Method Thereof
Application:
10/032,547 →
Contact Structure, Method of Forming the Same, Semiconductor Device, and Method of Manufacturing the Same
Application:
10/022,352 →
Method for Manufacturing a Semiconductor Device Having an Element Isolation Region
Application:
10/011,774 →
Method of Manufacturing Semiconductor Device, and Semiconductor Device Having Memory Cell
Application:
09/976,341 →
Semiconductor Element Test Apparatus, and Method of Testing Semiconductor Element Using the Apparatus
Application:
09/973,049 →
Semiconductor Device and Method for Manufacturing the Same
Application:
09/971,958 →
Semiconductor Integrated Circuit Device, and Method of Manufacturing the Same
Application:
09/968,032 →
Method for Manufacturing Semiconductor Device and Semiconductor Device Manufactured Thereby
Application:
09/960,974 →
Semiconductor Device with Resistor Elements Formed on Insulating Film
Application:
09/960,495 →
Polishing Solution Supply System, Method of Supplying Polishing Solution, Apparatus for and Method of Polishing Semiconductor Substrate and Method of Manufacturing Semiconductor Device
Application:
09/934,474 →
External Test Auxiliary Device to Be Used for Testing Semiconductor Device
Application:
09/927,366 →
Apparatus for Testing Semiconductor Integrated Circuit
Application:
09/927,470 →
Semiconductor Test Apparatus, and Method of Testing Semiconductor Device
Application:
09/927,367 →
Apparatus and Method for Testing Semiconductor Integrated Circuit
Application:
09/927,368 →
Apparatus and Method for Testing Semiconductor Integrated Circuit
Application:
09/927,404 →
Semiconductor Device with Reduced Cmp Dishing
Application:
09/915,566 →
Memory Device Redundant Repair Analysis Method, Recording Medium and Apparatus
Application:
09/912,534 →
Method of Manufacturing Semiconductor Device Having Passivation Film and Buffer Coating Film
Application:
09/910,824 →
Semiconductor Device
Application:
09/901,046 →
Semiconductor Device
Application:
09/901,113 →
Semiconductor Device Having Capacitors for Reducing Power Source Noise
Application:
09/846,272 →
Method and Apparatus for Testing Semiconductor Devices Using Improved Testing Sequence
Application:
09/840,069 →
Semiconductor Device
Application:
09/818,906 →
Semiconductor Device with Transfer Gate Having Gate Insulating Film and Gate Electrode Layer
Application:
09/766,846 →
Clean Room Having an Escalator, and Method of Transporting a Semiconductor Device Therein
Application:
09/765,428 →
Semiconductor Device Trimming Method, Semiconductor Device Trimming Apparatus, and Method for Creating Semiconductor Device Trimming Table
Application:
09/760,638 →
Semiconductor Device Having a Layered Wiring Structure with Hard Mask Covering
Application:
09/756,846 →