IP Library Granted Patent US 6,690,189
Granted Patent Utility
US 6,690,189 · Confirmation No. 5915

APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT

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Code Description Pages PDF
2003-12-04 IFEE Issue Fee Payment (PTO-85B) 1 View
2003-10-20 IDS Information Disclosure Statement (IDS) Form (SB08) 2 View
2003-10-20 FOR Foreign Reference 35 View
2001-08-13 TRNA Transmittal of New Application 2 View
2001-08-13 SPEC Specification 25 View
2001-08-13 CLM Claims 4 View
2001-08-13 ABST Abstract 1 View
2001-08-13 DRW Drawings-only black and white line drawings 7 View
2001-08-13 OATH Oath or Declaration filed 4 View
2001-08-13 LET. Miscellaneous Incoming Letter 1 View
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Quick Facts
Patent No.
US 6,690,189
App. No.
09/927,404
Filed
2001-08-13
Granted
2004-02-10
Pub. No.
US20020108080A1
Art Unit
2829
PTA
-20 days