Merger

Recorded: 2017-06-13 Received: 2017-06-13 Pages: 15

Assignor

Executed: 2014-04-01

Assignee

730, HORIGUCHI, HITACHINAKA-SHI, IBARAKI, JPX, JAPAN

Covered Properties (8)

Tester for Semiconductor Integrated Circuits

Application: 10/145,192 →

Semiconductor Device Provided with Memory Chips

Application: 10/140,104 →

Semiconductor Device That Can Have a Defective Bit Found During or After Packaging Process Repaired

Application: 10/127,759 →

Apparatus for Testing Semiconductor Integrated Circuit

Application: 09/927,470 →

Semiconductor Test Apparatus, and Method of Testing Semiconductor Device

Application: 09/927,367 →

Apparatus and Method for Testing Semiconductor Integrated Circuit

Application: 09/927,368 →

Apparatus and Method for Testing Semiconductor Integrated Circuit

Application: 09/927,404 →

Tester for Semiconductor Integrated Circuits and Method for Testing Semiconductor Integrated Circuits

Application: 09/904,625 →