Granted Patent
Utility
US 6,714,888
· Confirmation No. 7274
APPARATUS FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-02-19 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2001-08-13 | TRNA |
Transmittal of New Application | 2 | View | |
| 2001-08-13 | SPEC |
Specification | 25 | View | |
| 2001-08-13 | CLM |
Claims | 4 | View | |
| 2001-08-13 | ABST |
Abstract | 1 | View | |
| 2001-08-13 | DRW |
Drawings-only black and white line drawings | 7 | View | |
| 2001-08-13 | OATH |
Oath or Declaration filed | 4 | View |
Inventors
Attorneys & Agents of Record
Classification
USPC
702/120
Prosecution
- Examiner
- CHARIOUI, MOHAMED
- Art Unit
- 2857
- Docket No.
- 50090-333
- Confirmation No.
- 7274
Foreign Priority
2001-032851
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2001-02-08
·
JAPAN
Publication
- Pub. No.
- US20020107654A1
- Pub. Date
- 2002-08-08
Patent Term Adjustment
0days
No related applications found.
CHANGE OF ADDRESS
Recorded 2017-11-29
MERGER
Recorded 2017-09-19
CHANGE OF NAME
Recorded 2017-09-13
MERGER
Recorded 2017-06-13
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2004-04-07
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-09-10
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2001-08-13
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Quick Facts
- Patent No.
- US 6,714,888
- App. No.
- 09/927,470
- Filed
- 2001-08-13
- Granted
- 2004-03-30
- Pub. No.
- US20020107654A1
- Examiner
- CHARIOUI, MOHAMED
- Art Unit
- 2857
- PTA
- 0 days
External Links