Patent Assignment
Reel/Frame 043583/0156
CHANGE OF NAME
Recorded: 2017-09-13
Received: 2017-09-13
Pages: 15
Assignor
RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION
Executed: 2003-04-01
Assignee
RENESAS SEMICONDUCTOR ENGINEERING CORPORATION
1-3, MIZUHARA 4-CHOME, ITAMI-SHI, HYOGO, JPX, JAPAN
Covered Applications
(8)
TESTER FOR SEMICONDUCTOR INTEGRATED CIRCUITS
App. No. 10/145,192
→
SEMICONDUCTOR DEVICE PROVIDED WITH MEMORY CHIPS
App. No. 10/140,104
→
SEMICONDUCTOR DEVICE THAT CAN HAVE A DEFECTIVE BIT FOUND DURING OR AFTER PACKAGING PROCESS REPAIRED
App. No. 10/127,759
→
APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT
App. No. 09/927,368
→
APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT
App. No. 09/927,404
→
APPARATUS FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT
App. No. 09/927,470
→
SEMICONDUCTOR TEST APPARATUS, AND METHOD OF TESTING SEMICONDUCTOR DEVICE
App. No. 09/927,367
→
TESTER FOR SEMICONDUCTOR INTEGRATED CIRCUITS AND METHOD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUITS
App. No. 09/904,625
→