Granted Patent
Utility
US 6,642,736
· Confirmation No. 2988
TESTER FOR SEMICONDUCTOR INTEGRATED CIRCUITS AND METHOD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUITS
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2003-08-11 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2001-07-16 | TRNA |
Transmittal of New Application | 2 | View | |
| 2001-07-16 | SPEC |
Specification | 21 | View | |
| 2001-07-16 | CLM |
Claims | 7 | View | |
| 2001-07-16 | ABST |
Abstract | 1 | View | |
| 2001-07-16 | DRW |
Drawings-only black and white line drawings | 6 | View | |
| 2001-07-16 | OATH |
Oath or Declaration filed | 4 | View |
Inventors
Attorneys & Agents of Record
Classification
USPC
324/765
Prosecution
- Examiner
- CHAN, EMILY Y
- Art Unit
- 2829
- Docket No.
- 50090-312
- Confirmation No.
- 2988
Foreign Priority
2000-356724
·
2000-11-22
·
JAPAN
Publication
- Pub. No.
- US20020062200A1
- Pub. Date
- 2002-05-23
Patent Term Adjustment
-22days
No related applications found.
CHANGE OF ADDRESS
Recorded 2017-11-29
MERGER
Recorded 2017-09-19
CHANGE OF NAME
Recorded 2017-09-13
MERGER
Recorded 2017-06-13
CHANGE OF NAME
Recorded 2004-12-13
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2004-12-13
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2001-07-16
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Quick Facts
- Patent No.
- US 6,642,736
- App. No.
- 09/904,625
- Filed
- 2001-07-16
- Granted
- 2003-11-04
- Pub. No.
- US20020062200A1
- Examiner
- CHAN, EMILY Y
- Art Unit
- 2829
- PTA
- -22 days
External Links