IP Library Assignment 012009/0073
Patent Assignment
Reel/Frame 012009/0073

ASSIGNMENT OF ASSIGNOR'S INTEREST

Recorded: 2001-07-16 Received: 2001-07-31 Pages: 2
Assignors
MORI, HISAYA
Executed: 2001-06-12
FUNAKURA, TERUHIKO
Executed: 2001-06-13
YAMADA, SHINJI
Executed: 2001-06-13
Assignees
MITSUBISHI DENKI KABUSHIKI KAISHA
2-3, MARUNOUCHI 2-CHOME CHIYODA-KU, TOKYO 100-8310, JPX, JAPAN
RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION
1 MIZUHARA 4-CHOME, ITAMI-SHI, HYOGO 664-0005, JPX, JAPAN
Covered Application (1)
TESTER FOR SEMICONDUCTOR INTEGRATED CIRCUITS AND METHOD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUITS
App. No. 09/904,625