IP Library Granted Patent US 6,651,023
Granted Patent Utility
US 6,651,023 · Confirmation No. 4517

SEMICONDUCTOR TEST APPARATUS, AND METHOD OF TESTING SEMICONDUCTOR DEVICE

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Code Description Pages PDF
2003-09-25 IFEE Issue Fee Payment (PTO-85B) 1 View
2001-08-13 TRNA Transmittal of New Application 2 View
2001-08-13 A.PE Preliminary Amendment 3 View
2001-08-13 SPEC Specification 19 View
2001-08-13 CLM Claims 3 View
2001-08-13 ABST Abstract 1 View
2001-08-13 DRW Drawings-only black and white line drawings 7 View
2001-08-13 OATH Oath or Declaration filed 4 View
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Quick Facts
Patent No.
US 6,651,023
App. No.
09/927,367
Filed
2001-08-13
Granted
2003-11-18
Pub. No.
US20020106817A1
Art Unit
2857
PTA
0 days