Patent Assignment
Reel/Frame 012067/0545
Assignment of Assignor's Interest
Recorded: 2001-08-13
Received: 2001-08-17
Pages: 2
Assignors
FUNAKURA, TERUHIKO
Executed: 2001-06-14
MORI, HISAYA
Executed: 2001-06-14
YAMADA, SHINJI
Executed: 2001-06-14
Assignees
MITSUBISHI DENKI KABUSHIKI KAISHA
CHIYODA-KU, 2-3, MARUNOUCHI 2-CHOME, TOKYO 100-8310, JPX, JAPAN
RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION
ITAMA-SHI, 1 MIZUHARA 4-CHOME, HYOGO 664-0005, JPX, JAPAN
Covered Property
(1)
Semiconductor Test Apparatus, and Method of Testing Semiconductor Device
Application:
09/927,367 →