Patent Assignment
Reel/Frame 012369/0709
Corrective Assignment to Correct the Second Assignee Address Previously Recorded at Reel 012067, Frame 0545.
Recorded: 2001-12-13
Received: 2001-12-20
Pages: 3
Assignors
FUNAKURA, TERUHIKO
Executed: 2001-06-14
MORI, HISAYA
Executed: 2001-06-14
YAMADA, SHINJI
Executed: 2001-06-14
Assignees
MITSUBISHI DENKI KABUSHIKI KAISHA
2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO 100-8310, JPX, JAPAN
RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION
1 MIZUHARA 4-CHOME, ITAMI-SHI, HYOGO 664-0005, JPX, JAPAN
Covered Property
(1)
Semiconductor Test Apparatus, and Method of Testing Semiconductor Device
Application:
09/927,367 →