Patent Assignment
Reel/Frame 012085/0905
Assignment of Assignor's Interest
Recorded: 2001-08-13
Received: 2001-08-22
Pages: 2
Assignors
FUNAKURA, TERUHIKO
Executed: 2001-07-05
MORI, HISAYA
Executed: 2001-07-05
YAMADA, SHINJI
Executed: 2001-07-05
Assignees
MITSUBISHI DENKI KABUSHIKI KAISHA
2-3, MARUNOUCHI 2-CHOME, CHIYODA-KI, TOKYO 100-8310, JPX, JAPAN
RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION
1 MIZUHARA 4-CHOME, ITAMA-SHI, HYOGO 664-0005, JPX, JAPAN
Covered Property
(1)
Apparatus and Method for Testing Semiconductor Integrated Circuit
Application:
09/927,404 →