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App. No. 10/059,118 · Confirmation No. 5259

TEST PATTERN GENERATION CIRCUIT AND METHOD FOR USE WITH SELF-DIAGNOSTIC CIRCUIT

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2004-08-27 IFEE Issue Fee Payment (PTO-85B) 1 View
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2004-06-24 NOA Notice of Allowance and Fees Due (PTOL-85) 3 View
2004-06-24 892 List of references cited by examiner 1 View
2004-06-24 1449 List of References cited by applicant and considered by examiner 1 View
2004-06-24 IIFW Issue Information including classification, examiner, name, claim, renumbering, etc. 1 View
2004-06-24 FWCLM Index of Claims 1 View
2004-06-24 SRFW Search information including classification, databases and other search related notes 1 View
2004-06-14 SRNT Examiner's search strategy and results 1 View
2002-03-20 CFILE Request for Corrected Filing Receipt 5 View
2002-01-31 TRNA Transmittal of New Application 2 View
2002-01-31 SPEC Specification 9 View
2002-01-31 CLM Claims 2 View
2002-01-31 ABST Abstract 1 View
2002-01-31 DRW Drawings-only black and white line drawings 3 View
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2002-01-31 FRPR Certified Copy of Foreign Priority Application 20 View
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2002-01-31 FOR Foreign Reference 18 View
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Quick Facts
App. No.
10/059,118
Filed
2002-01-31
Granted
2004-10-05
Pub. No.
US20030018938A1
Art Unit
2133
PTA
0 days