IP Library › Assignment 012567/0087
Patent Assignment
Reel/Frame 012567/0087

Assignment of Assignor's Interest

Recorded: 2002-01-31 Pages: 2
Assignors
MATSUO, YUKIKAZU
Executed: 2001-01-15
NAGURA, YOSHIHIRO
Executed: 2001-11-15
Assignees
MITSUBISHI DENKI KABUSHIKI KAISHA
2-3, MARUNOUCHI 2-CHOME CHIYODA-KU, TOKYO 100-8310, JAPAN
RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION
1 MIZUARA 4-CHOME ITAMI-SHI, HYOGO 664-0005, JAPAN
Covered Property (1)
Test Pattern Generation Circuit and Method for Use with Self-Diagnostic Circuit
Patent: 6,802,034 →
Application: 10/059,118 →
Publication: US 2003/0018938
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 10, 2003
From: MITSUBISHI DENKI KABUSHIKI KAISHA
To: RENESAS TECHNOLOGY CORP.
Reel/Frame 014502/0289 →
Assignment of Assignor's Interest Apr 7, 2004
From: MITSUBISHI DENKI KABUSHIKI KAISHA
To: RENESAS TECHNOLOGY CORP.
Reel/Frame 015185/0122 →
Change of Name Sep 13, 2010
From: RENESAS TECHNOLOGY CORP.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024973/0598 →