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App. No. 10/345,950 · Confirmation No. 4741

APPARATUS, METHOD AND PATTERN FOR EVALUATING SEMICONDUCTOR DEVICE CHARACTERISTICS

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2004-06-25 IFEE Issue Fee Payment (PTO-85B) 1 View
2004-03-31 NOA Notice of Allowance and Fees Due (PTOL-85) 5 View
2004-03-31 892 List of references cited by examiner 1 View
2004-03-31 1449 List of References cited by applicant and considered by examiner 1 View
2004-03-31 IIFW Issue Information including classification, examiner, name, claim, renumbering, etc. 1 View
2004-03-31 SRFW Search information including classification, databases and other search related notes 1 View
2004-03-31 FWCLM Index of Claims 1 View
2004-03-18 SRNT Examiner's search strategy and results 4 View
2004-03-12 IDS Information Disclosure Statement (IDS) Form (SB08) 4 View
2003-01-17 A.PE Preliminary Amendment 3 View
2003-01-17 A.PE Preliminary Amendment 2 View
2003-01-17 SPEC Specification 18 View
2003-01-17 CLM Claims 5 View
2003-01-17 ABST Abstract 1 View
2003-01-17 DRW Drawings-only black and white line drawings 7 View
2003-01-17 OATH Oath or Declaration filed 3 View
2003-01-17 WFEE Fee Worksheet (SB06) 1 View
2003-01-17 WFEE Fee Worksheet (SB06) 1 View
2003-01-17 WCLM Claims Worksheet (PTO-2022) 1 View
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Quick Facts
App. No.
10/345,950
Filed
2003-01-17
Granted
2004-08-17
Pub. No.
US20030126567A1
Art Unit
2851
PTA
0 days