Patent Assignment
Reel/Frame 011756/0783
Assignment of Assignor's Interest
Recorded: 2001-04-26
Pages: 2
Assignor
TAKEDA, KUNIHIRO
Executed: 2001-04-20
Assignee
NEC CORPORATION
7-1, SHIBA 5-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Semiconductor Device Test System and Test Method
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.