Patent Assignment
Reel/Frame 025375/0895
Change of Name
Recorded: 2010-11-18
Received: 2010-11-18
Pages: 9
Assignor
NEC ELECTRONICS CORPORATION
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU,, KAWASAKI-SHI, KANAGAWA, JPX, 211-8668, JAPAN
Covered Properties
(92)
Fabrication of Low Power Cmos Device with High Reliability
Application:
09/872,007 →
Semiconductor Device and Method of Manufacturing the Same
Application:
09/871,943 →
Negative Feed-Back Amplifier and Method for Negative Feed-Back
Application:
09/872,730 →
Semiconductor Memory Device
Application:
09/872,291 →
Method for Compensating Exposure Value for Exposure Process in Semiconductor Manufacturing System
Application:
09/866,617 →
Test Method of Mask for Electron-Beam Exposure and Method of Electron-Beam Exposure
Application:
09/870,219 →
Semiconductor memory device
Application:
09/866,893 →
Semiconductor Device Having a Memory Cell Region and a Peripheral Circuit Region and Method of Manufacturing Thereof
Application:
09/864,259 →
Fault Analyzing System, Method for Pursuing Fault Origin and Information Storage Medium for Storing Computer Program Representative of the Method
Application:
09/864,327 →
Semiconductor Integrated Circuit Having Functional Macro with Improved Power Line Connection Structure
Application:
09/864,445 →
Wiring Structure of Semiconductor Device
Application:
09/864,255 →
Semiconductor Device Having the Effect That the Drop in the Current Gain Is Kept to the Minimum, When the Substrate Density Is Amplified and That the Variation in the Collector Current Is Improved
Application:
09/864,330 →
Timing Difference Division Circuit and Signal Controlling Method and Apparatus
Application:
09/864,735 →
Semiconductor Device and Method of Manufacturing the Same
Application:
09/863,737 →
Flash Memory Device with an Inverted Tapered Floating Gate
Application:
09/863,705 →
Bipolar Transistor in Which Impurities Are Introduced from Emitter Electrode Material to Form Emitter Region
Application:
09/862,375 →
Screening of Semiconductor Integrated Circuit Devices
Application:
09/859,478 →
Variable delay circuit
Application:
09/860,132 →
Output Circuit Converting an Internal Power Supply Potential into an External Supply Potential in a SEMICONDUCT0R Apparatus.
Application:
09/859,632 →
System of Manufacturing Semiconductor Integrated Circuit by Having a Client Connected to a Manufacturer via Two-Way Communication
Application:
09/855,723 →
Semiconductor Device with a Corrosion Resistant Bonding Pad and Manufacturing Method Therefor
Application:
09/855,720 →
Apparatus for Spin-Coating Semiconductor Substrate and Method of Doing the Same
Application:
09/854,614 →
Semiconductor Device Including a Mis Transistor
Application:
09/852,658 →
Semiconductor Device and Method for Making the Same
Application:
09/852,778 →
Method and Communication System for Data Communication via a Cable
Application:
09/854,123 →
Method and Apparatus for Detecting Line-Shorts by Potential and Temperature Distribution
Application:
09/852,177 →
Semiconductor Device and Semiconductor Wafer Having a Multi-Layered Insulation Film
Application:
09/851,313 →
Light Source for Integrating Modulator and Module for Optical Communication
Application:
09/850,115 →
Mask for Electron Beam Drawing Utilizing Auxiliary Patterns That Do Not Bore Through the Substrate
Application:
09/848,124 →
Oversampling Clock Recovery Circuit
Application:
09/847,311 →
Semiconductor Device
Application:
09/846,251 →
Semiconductor Memory
Application:
09/847,260 →
Method of Manufacturing a Repairable Flip Chip Semiconductor Device with Excellent Packaging Reliability
Application:
09/847,607 →
Design System for Flip Chip Semiconductor Device
Application:
09/844,351 →
Clock Control Circuit and Method
Application:
09/842,200 →
Semiconductor Device Test System and Test Method
Application:
09/842,158 →
Semiconductor device having a test pattern same as conductive pattern to be tested for short-circuit
Application:
09/843,090 →
Semiconductor Storage Device Data Sensing Method and Apparatus
Application:
09/844,238 →
High-Frequency Circuit and Its Module for Communication Devices
Application:
09/842,243 →
Appearance Inspection Apparatus and Method in Which Plural Threads Are Processed in Parallel
Application:
09/841,096 →
Method for Manufacturing Semiconductor Memory and Method for Manufacturing Capacitor
Application:
09/842,751 →
Method for Manufacturing Semiconductor Device, and Processing System and Semiconductor Device
Application:
09/840,386 →
Semiconductor Device and Manufacturing Method of the Same
Application:
09/839,298 →
Semiconductor Device
Application:
09/840,586 →
Low-Noise Buffer Circuit That Suppresses Current Variation
Application:
09/839,119 →
Scan Flip-Flop Circuit Having Scan Logic Output Terminal Dedicated to Scan Test
Application:
09/839,297 →
Method for Vaporization of Liquid Organic Feedstock and Method for Growth of Insulation Film
Application:
09/838,343 →
Method of Fabricating Semiconductor Device Having Ferroelectric Capacitor
Application:
09/838,186 →
Pseudorandom Number Generation Circuit and Data Communication System Employing the Same
Application:
09/837,484 →
Hyperbolic Type Channel Mosfet
Application:
09/838,087 →
Active Bias Circuit Having Wilson and Widlar Configurations
Application:
09/837,730 →
Semiconductor Device Having a Protective Circuit
Application:
09/837,823 →
Method for Manufacturing Semiconductor Devices
Application:
09/837,736 →
Substrate-Cleaning Method and Substrate-Cleaning Solution
Application:
09/835,412 →
Method of Forming S/D Extension Regions and Pocket Regions Based on Formulated Relationship Between Design and Measured Values of Gate Length
Application:
09/835,517 →
Reticle for Manufacturing Semiconductor Integrated Circuit
Application:
09/835,516 →
Non-Volatile Semiconductor Storage Apparatus with Overlapping Gates and Manufacturing Method Thereof
Application:
09/837,734 →
Jitter Detecting Circuit for Detecting Cycle-to-Cycle Jitter
Application:
09/836,688 →
Circuit Manufacturing Method and Apparatus, Anneal Control Method and Apparatus, Information Storage Medium
Application:
09/834,032 →
Method for Making Semiconductor Device Having Bent Gate Electrode
Application:
09/828,873 →
Semiconductor Device and Fabrication Method
Application:
09/835,958 →
Method of and Apparatus for Manufacturing Circuit
Application:
09/828,890 →
Semiconductor Device and Manufacturing Method Therefor
Application:
09/829,555 →
Semiconductor Device and Method for Manufacturing Same
Application:
09/828,862 →
Id Recognition Apparatus and Id Recognition Sorter System for Semiconductor Wafer
Application:
09/828,003 →
Drying apparatus and method
Application:
09/827,857 →
Appearance Inspection Method and Appearance Inspection Apparatus Having High Inspection Processing Speed
Application:
09/825,947 →
Grinding Slurry Recycling Apparatus
Application:
09/825,935 →
High-Performance Mos Transistor of Ldd Structure Having a Gate Insulating Film with a Nitride Central Portion and Oxide End Portions
Application:
09/824,672 →
Circuit Design Method for Designing Conductive Members with a Multilayered Structure to Have Antenna Sized of Proper Values
Application:
09/825,331 →
Semiconductor Device Capable of Surely Fixing Voltage at Well
Application:
09/821,101 →
Digital Phase Control Circuit
Application:
09/819,599 →
Image Rejection Mixer
Application:
09/821,002 →
Semiconductor Device and Method for Manufacturing Thereof
Application:
09/818,917 →
Program Development Compressed Trace Support Apparatus
Application:
09/819,351 →
Self-Sustained Pulsating Laser Diode
Application:
09/819,969 →
Method of Forming a Polycide Electrode in a Semiconductor Device
Application:
09/817,061 →
Semiconductor Memory Apparatus That Can Surely Attain Discharge Operation While Reducing Discharge Period When Reading Operation Is Done
Application:
09/817,049 →
Semiconductor Device Having Capacitor Which Assures Sufficient Capacity Without Requiring Large Space and Method of Producing the Same
Application:
09/815,841 →
Clock control circuit and clock control method
Application:
09/815,846 →
Sense Amplifier with Reference Cell Circuit
Application:
09/813,894 →
Apparatus for Selectively Cutting Fuse Electrodes
Application:
09/813,992 →
Nitride Based Semiconductor Device and Method of Forming the Same
Application:
09/810,546 →
Clock Period Sensing Circuit
Application:
09/810,203 →
Image Processing Apparatus and Method, and Computer Readable Storage Medium
Application:
09/814,691 →
Bipolar Transistor and Semiconductor Device Having the Same
Application:
09/805,135 →
Manufacture of a Semiconductor Device
Application:
09/804,788 →
Power Semiconductor Circuit
Application:
09/804,296 →
Intermediate Voltage Control Circuit Having Reduced Power Consumption Five
Application:
09/803,923 →
Operating Efficiency of a Nonvolatile Memory
Application:
09/803,094 →
Flip Chip Type Semiconductor Device and Method for Manufacturing the Same
Application:
09/801,901 →
Synchronous Delay Circuit and Semiconductor Integrated Circuit Apparatus
Application:
09/799,543 →