Granted Patent
Utility
US 6,495,856
· Confirmation No. 8432
Semiconductor device having a test pattern same as conductive pattern to be tested for short-circuit
Inventor:
Hiroaki Kikuchi
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2001-04-25 | TRNA |
Transmittal of New Application | 1 | View | |
| 2001-04-25 | SPEC |
Specification | 23 | View | |
| 2001-04-25 | CLM |
Claims | 5 | View | |
| 2001-04-25 | ABST |
Abstract | 1 | View | |
| 2001-04-25 | DRW |
Drawings-only black and white line drawings | 5 | View | |
| 2001-04-25 | OATH |
Oath or Declaration filed | 1 | View |
Inventors
Hiroaki Kikuchi
Tokyo, JAPAN
Attorneys & Agents of Record
Classification
USPC
257/48
H10P74/273
H10B12/033
H10B12/50
G11C29/02
G11C29/50
G11C29/50008
G11C2029/5002
Prosecution
- Examiner
- HUYNH, ANDY
- Art Unit
- 2818
- Customer No.
- 26339
- Docket No.
- KIM-01601
- Confirmation No.
- 8432
Foreign Priority
2000-127427
·
2000-04-27
·
JAPAN
Publication
- Pub. No.
- US20010035525A1
- Pub. Date
- 2001-11-01
Patent Term Adjustment
0days
No related applications found.
CHANGE OF ADDRESS
Recorded 2017-11-29
from
NEC CORPORATION
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-03-03
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Quick Facts
- Patent No.
- US 6,495,856
- App. No.
- 09/843,090
- Filed
- 2001-04-25
- Granted
- 2002-12-17
- Pub. No.
- US20010035525A1
- Examiner
- HUYNH, ANDY
- Art Unit
- 2818
- PTA
- 0 days
External Links