Patent Assignment
Reel/Frame 011772/0010
Assignment of Assignor's Interest
Recorded: 2001-04-25
Received: 2001-05-10
Pages: 2
Assignor
KIKUCHI, HIROAKI
Executed: 2001-04-12
Assignee
NEC CORPORATION
7-1, SHIBA 5-CHOME, MINATO-KU, TOKYO, JPX, JAPAN
Covered Property
(1)
Semiconductor device having a test pattern same as conductive pattern to be tested for short-circuit
Application:
09/843,090 →